At a glance
| Booth | T9508 |
| Country | JP |
| Product categories | Burn-In Systems · Functional Test Systems · Handlers; Positioner Systems · Memory Test Systems · Optical Test Systems · Package Test Systems · Parametric Test Systems · Probe Card Maintenance and Analysis Systems · Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers · Wireless, non-contact Test Systems |
| Website | yonata.co.jp/en |
Company profile
Next-generation measurement solutions that shape the future We are a supplier of cutting-edge test solutions for advanced semiconductors such as CPO and chiplets, leveraging high-speed optical/electrical measurement technologies and wafer/chip-level handling technologies. Our Next-generation measurement solutions that shape the future YONATA Electronic are a supplier of cutting-edge test solutions for advanced semiconductors such as CPO and chiplets, leveraging high-speed optical/electrical measurement technologies and wafer/chip-level handling technologies. Our three core competencies: - High-speed signal processing - Advanced handling - High-precision analog signal processing Enable us to provide comprehensive test solutions, from R&D to mass production. As a technology partner co-creating the future with our customers, we are committed to delivering forward-looking value at every step. YONATA Electronic provided test systems are: - 1.6T Optical Transceiver Tester for PIC, OE, and CPO wafer and die testing. - CPO Test Solutions - Laser Tester (Die-CoC Tester) - CoC BI Tester - Memory (DRAM HBM Nand) Tester - WAT Parametric, HV Parametric and Parallel Parametric Tester, three core competencies—high-speed signal processing, advanced handling, and high-precision analog signal processing—enable us to provide comprehensive test solutions, from R&D to mass production. As a technology partner co-creating the future with our customers, we are committed to delivering forward-looking value at every step.
Capabilities and products
- 1.6T Optical Transceiver Tester for PIC, OE and CPO wafer and die testing
- CPO Test Solutions
- Laser Tester (Die-CoC Tester)
- Memory (DRAM HBM Nand) Tester
- WAT Parametric, HV Parametric and Parallel Parametric Tester
- high-precision analog signal processing for semiconductor test
- high-speed optical/electrical measurement technologies
- high-speed signal processing for semiconductor test
- test solutions for CPO and chiplets
- wafer/chip-level handling technologies