At a glance
| Booth | T9508 |
| Country | JP |
| Website | yonata.co.jp/en |
Company profile
Yonata Electronics supplies next-generation test solutions for advanced semiconductors such as CPO and chiplets by combining high-speed optical/electrical measurement technologies with wafer- and chip-level handling technologies. Its three core competencies are high-speed signal processing, advanced handling and high-precision analog signal processing, which the company says support comprehensive test solutions from R&D through mass production. Yonata Electronics describes itself as a technology partner that co-creates future value with customers and responds flexibly to a wide variety of requests using its accumulated knowledge. The company provides services from technical consultation through implementation, handling product questions, technical consultations and discussions during the system-introduction consideration stage. Based in Koto-ku, Tokyo, it states that experienced staff provide prompt service across a wide region and make proposals tailored to customer needs. Its high-speed signal-processing capability includes expertise in high-speed ASIC design, PCB design technology and manufacturing processes, while its probe and handler capability is built around die-handler technology and know-how. The product and solution menu includes co-packaged-optics KGD test systems, Silicon Photonics PIC Wafer Test System, WAT & RDL Test Systems and HBM KGSD Test System. Yonata Electronics presents its focus as Optical x Electrical Test Solutions for the Cutting-Edge AI Industry and says it proposes solutions using its extensive knowledge while responding flexibly to varied requests. The test-system portfolio also lists a 1.6T Optical Transceiver Tester for PIC, OE and CPO wafer and die testing, CPO Test Solutions, Laser Tester (Die-CoC Tester), CoC BI Tester, Memory testers for DRAM, HBM and Nand, and WAT Parametric, HV Parametric and Parallel Parametric testers.
Exhibits
For optoelectronic devices, Yonata Electronics combines high-speed optical/electrical signal processing with chip-level handling to provide mass-production test solutions. It develops customized test systems for PIC, OE and CPO wafer and die testing, tailoring the systems to different device geometries and test requirements. The company designs and manufactures its own BERT boards to provide full RF test capability, and it uses multi-site testing to maximize test efficiency for high-volume production. As big data, cloud computing and 5G/AI infrastructure advance, Yonata Electronics positions high-speed communication testing as a foundation for the quality and performance of next-generation networks. Its high-speed communication test solutions center on DCA, CDR and BERT for optical transceivers, CPO and high-speed cables. The electrical-characterization and WAT test solutions provide fA/nV-level high precision with a triaxial SMU design. By suppressing system leakage current below 0.5 pA, these solutions are optimized for advanced-device applications including WAT and SiPh. The system adopts a standard PXIe architecture so it can integrate with ATE equipment. With AI data centers, high-bandwidth switches and high-speed interconnects developing rapidly, CPO is presented as a technology supporting next-generation optoelectronic integration and high-density packaging. Yonata Electronics provides a total CPO test solution covering silicon-photonics wafer testing, OE die-level testing and CPO module functional testing.
Capabilities and products
- CPO/chiplet advanced semiconductor test solutions
- high-speed optical/electrical measurement
- wafer/chip-level handling
- 1.6T optical transceiver PIC/OE/CPO wafer and die testing
- Silicon Photonics PIC Wafer Test System
- WAT/RDL test systems
- HBM KGSD test system
- Laser Die-CoC testing
- CoC burn-in testing
- DRAM/HBM/Nand memory testing
- WAT/HV/parallel parametric testing
- custom PIC/OE/CPO wafer and die test systems
- in-house BERT boards for full RF testing
- multi-site mass-production testing
- DCA/CDR/BERT high-speed communication testing
- fA/nV precision WAT measurement with triaxial SMU
- total CPO test solution