At a glance
| Booth | R7112 |
| Country | DE |
| Website | vxinstruments.com/vx-instruments-at-semicon-taiwan |
Company profile
VX Instruments GmbH develops and supplies high-performance measurement instruments and semiconductor test systems for demanding production and laboratory environments. Its systems are used in semiconductor manufacturing, power electronics, automotive engineering and industrial electronics, including continuous 24/7 operating environments. The company states that its modular systems are developed entirely in Germany and are designed for flexibility, reliability, precision and long-term stability. More than 500 VX Instruments systems are deployed across more than 30 countries. For over 30 years, the company has combined measurement know-how, application expertise and close customer cooperation to convert production requirements into measurement and test solutions. Its stated development approach emphasizes modular hardware, open interfaces and the ability to adapt systems as semiconductor and power-electronics test requirements change. The portfolio spans isolated PXI measurement instruments, source-measure units, power supplies, signal generation, digitizers and complete static and dynamic semiconductor test systems. A worldwide network of sales and service partners supports the installed base in international markets.
Exhibits
The semiconductor-test portfolio covers static and dynamic power-device testing from wafer-level characterization through final module validation, with modular architectures intended to address changing requirements across production stages. The STS8760neo Static Semiconductor Test System supports up to 10,000 V and 2,400 A, pulse lengths down to 100 microseconds and accuracy down to pA resolution, with isolated measurement technology and high-side measurements used to achieve very low noise levels. STS8760neo is designed for high-speed static parameter testing of medium- to high-power devices such as diodes, MOSFETs and IGBTs and uses a modular PXI platform with an open interface for additions such as DUT-specific resistor networks and temperature sensors. Its static-test functions are positioned for production throughput, including multi-station operation, sequencing software and a system architecture intended to reduce cost per test while retaining precision. The DTS8765neo Dynamic Semiconductor Test System is the company’s dynamic-parameter platform and is built for high-speed, precise testing of medium- to high-power semiconductors. DTS8765neo can be configured, for example, at 2,000 V and 10,000 A or 1,500 V and 20,000 A, and the broader system specification lists dynamic capability up to 3,000 V and 20,000 A. The dynamic platform is designed with very low DC-link inductance and can be expanded so that static and dynamic tests are performed on one test station. It supports dynamic parameter testing and safe-operating-area work for diodes, MOSFETs and IGBTs across a wide voltage range, using a modular PXI platform and an open interface for additional DUT-specific test functions. The DTS8765neo design includes an innovative testhead and focuses on the speed, precision and performance that VX Instruments identifies as differentiating characteristics of its semiconductor test systems. Together, STS8760neo and DTS8765neo cover static and dynamic testing of silicon, SiC and GaN power semiconductors from wafer and discrete-device stages through module-level validation. The LTS8620 Modular Laser Diode Test System is a PXI/PXIe platform for testing and qualifying laser diodes in fully automatic in-line, half-automatic or manual configurations. LTS8620 supports functional, parameter and in-circuit tests and generates freely programmable current pulses longer than 2 microseconds so that heat effects on the laser diode can be minimized during measurement. The laser-diode platform can measure bare dies and can measure photocurrent independently of the photodiode under test, while its NI LabVIEW-based software provides basic measurements that users can adapt or expand. The GT4210 Modular Functional and In-Circuit Test System supports boundary scan, multi-station, in-circuit, functional, parameter, flashing and parallel tests with fully automatic in-line, half-automatic, robot-handled or manual operation. GT4210 provides up to 4,640 test points and 20 PCI, PXI or PXIe slots and is based on established industry standards so configurations can be adapted to specific requirements and later production changes. Its ability to perform parallel and combined testing is intended to reduce the number of fixtures, production floor space, storage space, handling time and test time required for manufacturing. Generic Test Studio provides software for functional and in-circuit test programs, using parallel execution for high test speed, plug-in technology for production adaptation and standardized test methods for test-program creation. GTbuilder lets users assemble test sequences with ready-made GTML methods and visual drag-and-drop components without requiring detailed knowledge of the measurement hardware or a specific programming language, and its integrated compiler converts the result into a binary DLL for execution. GTengine executes the resulting test programs on manual, semi-automatic or fully automatic stations, manages production orders, loads configuration data, controls stations, evaluates measured values and stores results in databases or test reports. GTengine can exchange execution instructions, test orders, programs, results and status messages with a higher-level MES and provides workspaces, specimen-type data administration, debugging, live data displays, statistical evaluation including mean, sigma and CPK, and measurement-capability analysis. GTanalyzer loads and displays test reports for repair work or for evaluating production stability over a selected period. The PXI instrument portfolio includes PXM(e)7810 and PXM(e)7820 multimeasurement devices; PXD7113, PXD(e)721x, PXD730x, PXD732x and PXD731x/70xx digitizers; and PXA(e)73xx current generators and PXA(e)72xx arbitrary waveform generators. Digital I/O and control products include PXTe5401 and PXT(e)1741 trigger modules, PXI(e)520x bit-pattern generators, PXI(e)530x bit-pattern receivers and the PXIe3110 embedded controller. High-current source-measure units include the AXC85xx family at 600, 1,200 or 2,400 A and the AXC76xx family at 2,000 A, while high-voltage SMUs include AXV7680 at 10,000 V and AXV7607 at 2,500 V. Additional source-measure and power products include AXS7720 and AXS844x multichannel SMUs, PX773x and PXS(e)840x PXI or PXIe SMUs, and VX6626 and VX6620 system power supplies. Across these instruments and systems, the modular PXI architecture supports development, production and laboratory measurement tasks ranging from fast data acquisition and signal processing to static and dynamic characterization of power semiconductors. The broader system family combines isolated PXI measuring instruments with complete test systems so that precision measurement hardware can be integrated into production-oriented semiconductor, functional and in-circuit test configurations. STS8760neo is also described as particularly fast and multi-station capable, using high-speed testing to increase throughput while maintaining the high-precision static measurements required for power-semiconductor production. For LTS8620, the supplied NI LabVIEW-based software contains basic measurements that users can adapt or expand, which lets the same laser-diode platform be adjusted to different qualification tasks without replacing the underlying PXI system. LTS8620 can be deployed as a fully automatic in-line, half-automatic or manual station, making its short-pulse laser-diode measurement capability available in both production automation and engineering or laboratory workflows. GT4210 is based on established industry standards and can be individually configured for a required test task, then adapted efficiently when production challenges or test requirements change. Because GT4210 supports combined testing and parallel execution, a production line can consolidate functions that would otherwise require more fixtures, handling steps and separate test resources.
Capabilities and products
- static-parameter power semiconductor test systems
- dynamic-parameter power semiconductor test systems
- PXI/PXIe laser diode test systems
- modular in-circuit and functional test systems
- functional and ICT test-program software
- drag-and-drop test sequence creation
- production test execution and MES integration
- test report analysis
- PXI/PXIe multi-measurement devices
- PXI/PXIe waveform digitizers
- PXI/PXIe arbitrary current generators
- PXI/PXIe arbitrary waveform generators
- PXI/PXIe trigger modules
- PXI/PXIe bit-pattern generators
- PXI bit-pattern receivers
- high-current SMUs (600/1200/2400 A, 2000 A)
- high-voltage SMUs (10,000 V, 2500 V)
- multi-channel SMUs
- PXI/PXIe source measure units
- PXI system power supplies
- PXIe embedded controllers