At a glance
| Booth | N0467 |
| Country | TW |
| Website | www.memstec.com.tw |
Company profile
TEKSCAN, MEMS Technology was established in 2001 to provide current measurement technologies and comprehensive services for customers with growing and varied measurement requirements. The company states that solving customer problems is a central direction of its work and that continued customer support and recognition have accompanied its growth. Its principal services include introducing and selling overseas measurement concepts, technologies, and products, as well as providing professional design and system development for different application requirements. The service model is organized around Testing, Sensor, System, and Solution: precise and complete test reports, sensor selection and application, equipment selection according to requirements and experiments, and solutions based on professional technology and accumulated experience. Its listed sales fields include vehicle testing, electronic-product quality inspection, biomechanics, semiconductor-process testing, medical institutions, precision-measurement laboratories, precision industrial control and inspection, certification and inspection centers, Industry 4.0 control applications, and universities and colleges. The company expanded its regional presence with a Suzhou office in 2007, Malaysia and Singapore offices in 2008, a Beijing office in 2011, and a Shenzhen office in 2013. Its product and brand milestones include beginning sales of MTI non-contact displacement and vibration-measurement sensors in 2002, Bertec force plates and multi-axis force sensors in 2003, and NMB strain gauges, load cells, amplifiers, and industrial displays in 2005. It began selling Tekscan Industry pressure sensors in 2006, later added Tekscan Medical products in 2014 and Tekscan Dental products in 2016, and also expanded into optical-fiber sensors, motion-capture integration, electromyography, jaw-motion equipment, and mold-pressure systems through other represented brands.
Exhibits
TEKSCAN, MEMS Technology provides Tekscan patented tactile-measurement and pressure-mapping solutions that deliver actionable information for optimizing product design or improving clinical and research outcomes. The sensors and systems are used as standalone solutions or embedded technology, with operation and accurate measurement intended to support better product development. Pressure-mapping applications include graphical evaluation of tire-footprint pressure, tire-tread design, quality control during tire manufacturing, and automotive-suspension analysis. Strideway™ is presented as the first modular gait-analysis measurement walkway; its high-resolution version maps the plantar surface with more precise structural positioning and supports detailed regional analysis for applications such as children's gait analysis. To improve data accuracy, Strideway includes two lead-in plates installed on both sides of the walkway so patients or subjects can establish a more comfortable gait before data collection. Elogger™ is a strain-measurement system designed for printed-circuit-board strain testing, including solder-ball cracking, trace damage, pad separation, and substrate cracking, with real-time data monitoring to help avoid failures during testing. Elogger is described as lightweight, portable, and impact-resistant, supports multiple host modules, provides Simplified Chinese, Traditional Chinese, and English interfaces, outputs Diagonal Strain, Max/ Min Principal strain, and Strain Rate data, and can connect directly to strain gauges and thermocouples. Through work with numerous hospitals, clinics, and research organizations on plantar-pressure research and treatment, the company says it came to understand the importance of insoles for correction and continued considering how to integrate plantar-pressure information with insole information. It therefore introduced Pedcad custom-insole technology from Germany and built an end-to-end insole production process intended to help customers obtain high-quality, effective insoles more quickly and easily. For semiconductor-process work, Tekscan pressure-distribution systems are listed for CMP film lamination, wafer bond, probe-card, and brush-cleaning applications, using dedicated test systems to improve yield and reduce cost. The semiconductor measurement portfolio also includes the MTI Proforma 300i, a manual wafer-thickness measurement system that uses a differential capacitive measurement principle for non-contact thickness measurement of semiconductor and semi-insulating wafers. Proforma 300i includes an Ethernet interface and control software, a front-panel USB port for rapid data storage, MTI capacitive sensors, a non-contact measurement method, support for wafer diameters from 76-300mm, optional wafer measurement rings, and optional calibration wafers. The Proforma 300SA is a semi-automatic wafer measurement system for semiconductor or semi-insulating materials and measures thickness, thickness variation, bow, warp, and flatness. Its scan mode can generate a complete three-dimensional wafer image, and the measurement process can output customized data reports for checking the condition of individual wafers. Proforma 300SA supports 150mm, 200mm, and 300mm wafers and materials including Si, GaAs, Ge, SiC, and InP, across cut, ground, etched, polished, and patterned surfaces and both P-type and N-type conductivity. The 300SA lists a 1000µm thickness measurement range without recalibration, Windows compatibility, ASTM-standard measurements, SEMI S2-0200 health-and-safety compatible design, and SEMI S8-0999 ergonomic design. For the PROFORMA 300SA module, the listed measurement range is up to 1700μm with .03μm accuracy and 0.05 µm resolution; its ASTM specifications also cover thickness, TTV, Bow, warp, Sori, and site and global flatness. The broader measurement portfolio lists thin-film pressure distribution, Fuji pressure-sensitive paper, industrial and medical thin-film pressure mapping, FlexiForce single-point thin-film force sensing, strain gauges and strain services, load and multi-axis force measurement, pressure, torque and acceleration measurement, FBGS fiber sensing, and non-contact displacement measurement. Other listed systems cover OptiTrack motion capture, TMM motion-analysis software, Bertec force plates, T-Scan dental occlusion, BioJAV joint-vibration analysis, JT-3D jaw tracking, BioEMG electromyography, Nip Control, Thermoscale and UVscale test papers, bearing-quality testing, EV charging power-quality monitoring, vibration monitoring and predictive maintenance, injection-molding cavity pressure, metal detection, checkweighing, and InstruNet, EasyDAQ, and DR1000 data-acquisition systems.
Capabilities and products
- semiconductor-process pressure mapping for CMP, wafer bonding, probe cards and brush cleaning
- Elogger strain measurement systems for PCBs
- contract stress measurement services
- supply of MTI wafer thickness measurement systems
- supply of in-mold pressure measurement systems for plastic injection molding
- smart vibration monitoring and predictive maintenance systems
- supply of pedcad custom insole production systems
- supply of T-Scan electronic dental occlusion systems
- agency for integrated motion-capture systems (The MotionMonitor)
- agency for force plates and multi-axis force sensors (Bertec)
- agency for strain gauges, load cells and amplifiers (NMB)
- agency for pressure sensors (Tekscan)