At a glance
| Booth | K2043 |
| Country | TW |
| Website | www.se-group.com |
Company profile
SE Technologies Corp. was founded on Jan. 1st, 1993, originated from engineers, and approaches test requirements from an engineer's perspective while serving RF/Microwave, semiconductor, high-precision electronics, optoelectronics, MEMS, and nano-technology fields and introducing solutions to engineers in the Greater China area. Its stated provision includes wafer-level high-precision probe stations and related peripherals; micro-nano pitch probes, probe cards, and probe holders; PCB signal-integrity testing and high-frequency probes; ESD electrostatic-discharge test equipment; advanced channel simulators; RF-link simulation for terrestrial and satellite wireless systems; and RF/microwave and PCB test fixtures. The company's product categories also include RF test equipment for wireless communications, ICM RF/microwave component test fixtures, microwave and RF production test, semiconductor electrical test probe stations, four-point probe resistivity systems, high-power test equipment, nanoscale measurement, PCB and substrate signal-integrity test, RF probes, electronic-optics and electronic-design test automation, Microvue automated test software, SCS-Parylene Deposition, Ionograph series ionic-contamination testing, and Spin Coater Series. Its listed test-equipment peripherals and communication-related offerings include micropositioners, Probe Tips & Holders, Socket & Fixtures, GTL RF probe and positioner series, differential probes, RF/microwave probes, wireless-communication RF test equipment, Prognostic Health Management (PHM), an Adaptive Remaining Useful Life Estimator, and power-supply life estimation and health management. SE Technologies Corp. lists applications including Automatic Tuner System, Reliability Test System, Failure Analysis, TDR/TDT, and semiconductor electrical measurement, and states a long-term goal of integrating an Asian marketing and service network. Its corporate-culture statement describes a goal of providing employees with a simple and comfortable work environment and a long-term aim of becoming an EMPLOY OWNED COMPANY, together with complete planning before work, objective performance evaluation afterward, and a work-life balance.
Exhibits
The semiconductor probe-station range includes manual and semi-automatic precision DC/RF probe stations for 4-inch, 6-inch, 8-inch, and 12-inch wafers as well as millimeter-wave on-wafer RF probing. The four-point probe resistivity measurement system lists an optional measurement range of 1 μ Ω~10G Ω. The SAKYIWA NanoProber Series provides high-speed extraction of sheet resistance, 4-wire Kelvin resistance, and FET properties at micro and nanoscale dimensions for semiconductor, thin-film, LED, and photonics testing. The reliability ESD test offering lists a high-voltage supply range of 50 V to 8kV, (250 V to 16kV optional), and wafer-level chip-packaging testing for BGA, PGA, LGA, QFN, LCC, QFP, TSSOP, PQFP, Flat Pack, and WLCSP with ultra-fine pitch as low as 0.3mm and device pin counts over 3700 pins. POGO PIN BLOCKS and connector-saver interfaces are designed to turn complex DUT or breakout boards into universal motherboard-style interfaces, accommodate a range of physical and electrical test requirements, interface with many industry-standard board-to-board connectors, and reduce connector wear by allowing a degrading connector saver to be replaced instead of the entire board.
Capabilities and products
- 4- to 12-inch DC/RF probe stations
- millimeter-wave on-wafer RF probing
- four-point probe resistivity measurement
- wafer-level package ESD testing