At a glance
| Booth | N0592 |
| Country | JP |
| Product categories | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · Weight measurement; precision scales · X-ray; XRF; 3-D X-Ray; LEXES Systems · Equipment, Nanotechnology Tools · Inspection and Metrology · Thin Film · Wafers · Optics; Lens Products; Auto-Focus Systems |
| Website | www.rigaku.com/index_world.html |
Company profile
Founded in 1951 in Tokyo, Japan, Rigaku is an analytical and industrial instrumentation leader. With numerous innovations, the Rigaku group of companies is now a global authority in several fields, including X-ray diffraction (XRD), thin-film analysis (XRF, XRD, and XRR), X-ray fluorescence spectrometry (TXRF, EDXRF, and WDXRF), small-angle X-ray scattering (SAXS), protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology (TXRF, XRF, XRD, and XRR), X-ray Topography Imaging, X-ray sources, computed tomography, non-destructive testing, and thermal analysis While X-ray and related technologies are the foundation of Rigaku’s business, its true strength lies in its commitment to working with customers. By fostering partnerships and driving innovation, Rigaku powers new perspectives and tailor-made solutions to meet the diverse needs of industry, academia, and government. With a global presence and over 2,000 employees worldwide, Rigaku values collaboration between users and employees to ensure alignment with customer needs and market trends. Its products and services drive innovation in fields as diverse as semiconductor chip design, drug discovery, and nanotechnology research. We value our customers, value our people, and value our technology. The company’s mission is to contribute to the enhancement of humanity through scientific and technological development.
Capabilities and products
- Raman spectroscopy
- X-ray Topography Imaging
- X-ray diffraction (XRD)
- X-ray fluorescence spectrometry (TXRF, EDXRF and WDXRF)
- computed tomography and non-destructive testing
- semiconductor metrology by TXRF, XRF, XRD and XRR
- small-angle X-ray scattering (SAXS)
- thin-film analysis by XRF, XRD and XRR