At a glance
| Booth | J3153 |
| Country | TW |
| Website | www.raditech.com.tw |
Company profile
Radiation Technology Co., Ltd. follows a customer-oriented business philosophy and serves academic and industrial fields including electronics, optical imaging, CD-R, semiconductor, TFT-LCD, LED, touch screen, solar cells, Touch Panel, Epaper, and photovoltaic applications. The company was founded in 1993 in Taiwan and established its Shanghai branch, 致東光電科技上海有限公司, in 2005. Radiation Technology Co., Ltd. describes itself as a professional supplier of Spectroscopic Ellipsometers, Spectroscopic Reflectometers, ellipsometers, reflectometers, and integrating-type rough-surface reflectance measurement instruments. It also describes itself as the only domestic manufacturer of self-developed inspection instruments, serving semiconductor and TFT-LCD companies as well as major domestic research institutions and laboratories. The company states that it has accumulated nearly 20 years of optical-detection experience and has used that experience to develop application-specific optical equipment. Its self-made optical equipment record exceeds several hundred units, including instruments developed for film-thickness and solar-cell optical measurement applications. Radiation Technology Co., Ltd. emphasizes customer orientation, innovation, and service, and recruits experienced personnel to integrate closely with customer needs and provide reliable value-added support. The company states that customer satisfaction is its goal and follows the three elements of high mobility, high efficiency, and high action to provide high-tech products, technical advice, after-sales service, and efficient support. Its future vision is to continue growing steadily, establish a sound operating foundation, and develop toward an all-round enterprise recognized by customers and principals.
Exhibits
Radiation Technology Co., Ltd. supplies Spectroscopic Reflectometer (SR), Spectroscopic Ellipsometer (SE), Single Wavelength Ellipsometer (SWE), dual-wavelength ellipsometer (DWE), Diffusion 8° Integration Sphere Spectroscopic Reflectometer (D8SR), Combo Equipment (SWE+D8), and spectrometers. Its UV-VIS-NIR full-spectrum ellipsometer is self-developed for film-thickness measurement, while its UV-VIS-NIR full-spectrum reflection-type film-thickness instrument is a self-developed reflectometer. For high-precision film-thickness measurement, Radiation Technology Co., Ltd. developed full-spectrum Spectroscopic Ellipsometer (SE) and full-spectrum Spectroscopic Reflectometer (SR) instruments as well as single- and dual-wavelength ellipsometers (SWE/DWE). For solar-industry crystalline-silicon and non-crystalline-silicon applications, the company developed the D8 reflection instrument along with related optical equipment identified as Taiwan, TAR, and HAZE in its product description. The D8SR is a solar reflection optical-efficiency measurement instrument developed specifically for solar-cell measurement. The company provides customizable optical measurement equipment to address customer measurement requirements. Its equipment can be integrated with in-line measurement to support timely monitoring of process quality. Across these offerings, the measurement portfolio covers coating and film-thickness measurement as well as reflection and ellipsometry-based optical characterization for electronics, semiconductor, display, and photovoltaic production environments.
Capabilities and products
- spectroscopic ellipsometers (SE)
- spectroscopic reflectometers (SR)
- single-/dual-wavelength ellipsometers (SWE/DWE)
- integrating rough-surface reflectance measurement instruments
- solar-cell reflectance optical-efficiency measurement instrument
- spectrometers
- customizable optical measurement equipment
- in-line measurement integration and real-time process monitoring