At a glance
| Booth | I2430 |
| Country | TW |
| Website | www.quatek.com.tw |
Company profile
Quatek International Limited Taiwan Branch is a leading agent for electronic precision measurement systems, with products used in communication, solar technology, LED/LCD, national defense, electronic industry, and machinery industry, as well as laboratories and factories in semiconductor, nanotechnology, physics, and high-tech materials. Its principals come from the USA, Canada, the UK, Switzerland, Germany, and Japan. As its business grew, Quatek International Limited Taiwan Branch opened branch offices in Taipei, Hsinchu, Kaohsiung, Shanghai, Shenzhen, Beijing, Xiamen, Xi' an, Chengdu, and Wuhu to serve customers in Taiwan and China, and it is extending services to Japan and Southeast Asia. The company describes itself as both a professional agent for advanced instruments and an experienced provider of solutions and after-sales services. Its sales and service engineers provide instrument installation, product training, product maintenance and repair, R&D, product design, and manufacture. Quatek International Limited Taiwan Branch also seeks advanced and suitable instruments for customer needs and provides services through its established sales channel with the stated aim of helping customers become more competitive.
Exhibits
The portfolio covers resistivity, PN type, and minority carrier lifetime measurement; wafer thickness, film thickness, and stress measurement; and probers, probe cards, and other semiconductor-related equipment. It also includes advanced-packaging PVD equipment, protective-glass diamond-like carbon coating, and non-contact sheet-resistance and ultra-high-resistance measurement. Semiconductor inspection and characterization offerings include wafer surface-defect, geometry, and topography scanning, deep-level transient spectroscopy testing, and PL fluorescence spectroscopy and electroluminescence. The listed process equipment includes plasma-enhanced chemical vapor deposition systems. Optical measurement offerings include reflectance and transmittance measurement together with standard light sources and integrating spheres. The portfolio also lists AR/VR production-line test systems compliant with the latest SID and IEC standards and 2D birefringence test systems for internal-defect inspection in SiC crystals. For semiconductor-device testing, the product lineup includes the SLIC-AC 3015 SiC module dynamic tester, a common-mode transient immunity system using 731 Pulse Generator plus 5081-P Ramp Module, the TRd 2015 automotive-grade IGBT module low-inductance dynamic test system, TP0620 portable power-device tester, DMS diode dynamic-characteristic tester, PRO AC Series and PRO DC Series medium-power device systems, and TRd Series high-power IGBT/MOSFET dynamic test systems. For flat-panel applications, the offering covers optical inspection, resistivity and film-thickness measurement, consumables and coater nozzles, liquid-crystal resistance measurement, touch-screen inspection, protective-glass diamond-like carbon coating, AMOLED, MicroLED/MiniLED, and silicon-based OLED; listed equipment includes the VDU-1160 2D spectral imaging colorimeter, PG202/191FL semi-automatic protective-glass AR Coating measurement system, NED-LMD M Series near-eye display test system, VT200 automatic optical and visual inspection equipment, NED-LMD W200-Series production near-eye optical measurement system, NED-LMD E100 and E101 laboratory near-eye systems, GS-1160 spectrometer, and GS-191FA-1045 automatic reflectance tester. Resistivity and sheet-resistance products include the RT-3000/RG-2000(3000) high-precision semi-automatic four-probe resistivity tester, WS-3000 automatic four-probe sheet-resistance system, Cresbox semi-automatic mapping tester, RT-70V series manual four-probe system, NC-80MAP non-contact multipoint system, EC-80P handheld non-contact tester, EC-80 non-contact sheet-resistance tester, and NC-10 non-contact resistance and resistivity system. Wafer and film measurement products include the WPA-300 wide-range 2D birefringence system, PA-300 2D birefringence system for SiC internal-defect inspection, SE-101 high-speed single-point ellipsometer, ME-210 semi-automatic high-speed ellipsometer, TIM-10TFV-SR semi-automatic film measurement analyzer, TIM-10/30TFV film-thickness analyzer, TIM-10/30TFV-MSXG wafer-level semi-automatic film-thickness analyzer, and NanoSpec II automatic film-thickness tester. For flat-panel and film applications, the lineup includes NanoSpec II, the RT-3000 / RG-1000F automatic four-probe sheet-resistance system, DUORES handheld sheet-resistance equipment, NC-60F / RS-1300N automatic non-contact resistance systems, NC-700 and NC-600 in-line non-contact sheet-resistance modules, FilmTek 3000M micro-area spectral transmittance and reflectance measurement, and FilmTek 1000 spectral reflectometry. Compound-semiconductor offerings include film-thickness and resistivity measurement, PL fluorescence spectroscopy and electroluminescence, Hall-effect measurement, electrochemical CV, epitaxial-layer thickness measurement, non-contact sheet resistance and ultra-high resistance, wafer surface-defect and geometry/topography scanning, deep-level transient spectroscopy, LED optical testing, probe stations and probes, plasma-enhanced chemical vapor deposition, and exposure equipment, with listed instruments including NanoSpec II, Cresbox, FilmTek 3000M, FilmTek 1000, RT-70V series, 5601TSR / QT-50, FilmTek 1500, and FilmTek 2000M. Probe-station products include the FAPG150D automatic double-sided probe station, FAPG150 automatic single-sided probe station, PG101WIS wafer-level optoelectronic inspection equipment, PG101-RF manual RF probe station, PG3000 12-inch semi-automatic probe station, A200D 8-inch automatic double-sided wafer probe station, A200 8-inch automatic wafer probe station, and S300 12-inch semi-automatic wafer probe station. Wafer-sorting equipment includes the NC-3000F automatic robot-and-belt sorter, NC-2000FLA automatic robotic sorter, NC-6800 non-contact conveyor sorter, NC-3000R non-contact robotic sorter, UltraMap C200L automatic wafer sorting system, and WS-8800 automatic four-probe wafer sorting system. Compound-semiconductor probe-station options include A200D and A200 8-inch automatic systems, S300 and S200 semi-automatic systems, M200FA manual wafer-analysis probe station, S200FA-HV semi-automatic high-voltage probe station, S300FA 12-inch semi-automatic wafer-analysis probe station, and S200FA 8-inch semi-automatic wafer-analysis probe station. LED optical-test products include the TV200 automatic optical and visual inspection system, VI500 automatic LED appearance optical/electrical tester, an LED tester, AT100 automatic COB LED tester, RT800 LED reliability tester, 940LED Goniometer high-precision viewing-angle system, GS-1220 LED spectrometer, and SRI-PL-6000 LED grow-light meter. Solar-process offerings include film-thickness and reflectance measurement, resistivity, PN type, minority-carrier lifetime and carbon/oxygen-content measurement, solar simulators, concentrating-solar equipment, ion implantation, and photovoltaic PVD equipment, with listed instruments including the Qphoton-L laser spectral ellipsometer, NanoSpec II automatic film-thickness tester, FilmTek 3000M, FilmTek 1000, FilmTek 1500, FilmTek 2000M, FilmTek 3000, and FilmTek 4000. PL and electroluminescence products include the YWafer RD8-CP fluorescence spectrometer, RPMBlue FS rapid photoluminescence mapping system, Imperia high-end rapid photoluminescence mapping system, VerteX ultra-high-precision photoluminescence spectroscopy system, and M2442 electroluminescence characteristic test system for LED epitaxial wafers.
Capabilities and products
- Supply of PN conductivity-type measurement equipment
- Supply of minority-carrier lifetime measurement equipment
- Supply of wafer thickness measurement equipment
- Supply of thin-film thickness measurement equipment
- Supply of wafer stress measurement equipment
- Supply of probe cards
- Supply of ultra-high-resistance measurement equipment
- Supply of wafer surface defect inspection equipment
- Supply of wafer geometry and topography scanning equipment
- Supply of deep-level transient spectroscopy test equipment
- Supply of PECVD plasma-enhanced chemical vapor deposition equipment
- Supply of standard light sources
- Supply of integrating spheres
- Supply of AR/VR near-eye display test systems
- Supply of 2D birefringence test systems for SiC crystal defects
- Supply of carbon and oxygen content measurement equipment
- Supply of exposure systems
- Supply of coater nozzles
- Supply of liquid-crystal resistance measurement equipment
- Supply of touchscreen inspection equipment
- Supply of diamond-like coating solutions for cover glass
- Supply of solar simulators
- Supply of ion implanters
- Supply of Hall-effect measurement equipment
- Supply of electrochemical C-V measurement equipment
- Supply of epitaxial-layer thickness measurement equipment
- Supply of test probes
- Supply of spectrometers
- Supply of night-vision devices
- Supply of optical power meters
- Supply of image-quality test equipment
- Supply of multifunction calibrators
- Supply of high-precision digital multimeters
- Supply of standard power sources
- Supply of resistance, capacitance and inductance standards
- Supply of safety test instruments and reference sources
- Supply of high-precision LCR meters and bridges
- Supply of electrostatic monitoring equipment
- Supply of electrostatic measurement equipment
- Supply of static elimination equipment
- Supply of antistatic performance test equipment
- Supply of cleanroom airborne particle counters
- Supply of high-voltage sources and pulse sources
- Supply of picosecond voltage pulse sources
- Supply of arbitrary waveform generators
- Supply of SMT component inspection equipment
- Supply of automated circuit-board test and fault-detection equipment
- Supply of power-quality monitoring equipment
- Supply of power analysis equipment
- Supply of electromagnetic interference pre-compliance test instruments
- Supply of road-safety retroreflective material test equipment
- Supply of toner Q/M charge testers
- Supply of high-voltage power supplies
- Supply of low-voltage power supplies
- Supply of engineering-plastic additives
- Supply of engineering-plastic pellets
- Supply of engineering-plastic profiles
- Supply of common-mode transient immunity test systems
- Supply of power-device static testers
- Supply of power-device dynamic test equipment
- Supply of antistatic consumables
- Supply of antistatic engineering materials
- Supply of elemental analysis equipment
- Supply of 2D spectral imaging colorimeters
- Supply of four-point-probe resistivity and sheet-resistance measurement equipment
- Supply of non-contact sheet-resistance and resistivity measurement equipment
- Supply of ellipsometers
- Supply of microscale spectral transmission and reflection measurement equipment
- Supply of inline non-contact sheet-resistance measurement modules
- Supply of spectral transmission and reflection measurement equipment
- Supply of wafer probe stations
- Supply of wafer-level optoelectronic device inspection equipment
- Supply of wafer sorting equipment
- Supply of LED appearance, optical and electrical test equipment
- Supply of COB LED test equipment
- Supply of LED reliability test equipment
- Supply of LED viewing-angle measurement equipment
- Supply of LED grow-light meters
- Supply of microscale spectral refractive-index testers
- Supply of photoluminescence spectroscopy and mapping equipment
- Supply of LED epitaxial-wafer electroluminescence test systems
- Supply of PVD equipment for advanced packaging and photovoltaics
- Measurement instrument installation
- Measurement instrument maintenance and repair
- Measurement instrument operation training