At a glance
| Booth | K2876 |
| Country | TW |
| Website | www.nhkspg.co.jp/eng/products/microcontactor/index.html |
Company profile
NHK SPRING CO., LTD. was established in 1939 and is one of the world's leading spring manufacturers, applying ultra-precision technology to key components for advanced equipment, including micro-probing contactors that use the world's smallest coil-spring. NHK SPRING is also involved in semiconductor-industry product development and developed precision Pogo pins for semiconductor test and burn-in applications. The Pogo-pin range covers 0. 120 mm pitch to 1. 00 mm pitch, supports high-frequency capability above 10GHz with reference to specification, provides stable contact resistance, and has mechanical durability of more than 1 million touchdowns under ambient temperature according to NHK SPRING's testing method. NHK SPRING cleaning sheets support easy maintenance, with both offline and online cleaning possible. The semiconductor test portfolio includes Fine Pitch RF Probe Card, High Pin Count High Speed Probe Card and WCSP Probe Card. It also includes Logic Test and RF Test Socket for Manual and Handler Test, FSP High Reliability, Low Resistance Probe and High Frequency RF Test Contactors. Additional solutions include Kelvin Test Socket Solution, Package on Package Memory Socket Solution, Thermal Control Socket, Snap On Socket Strip Kelvin Test Socket, High Current Solution and HDD High Precision and High Reliability Microtechnology.
Exhibits
NHK SPRING manufactures and sells Microcontactor, an independently developed contact-probe structure used to test the electrical characteristics of semiconductor wafers and semiconductor packages. Microcontactor products are produced in-house, and product designs can be customized to meet customer needs. Semiconductor testing applies electricity to a semiconductor product, generates input signals from a test program for the product under inspection, and compares them with expected output signals; testing is performed after wafer circuits are formed in the front-end process and after product assembly in the back-end process. A semiconductor test fixture connects semiconductor products with semiconductor test equipment, and NHK Spring supplies probe cards or probe heads for front-end processes and test sockets for back-end processes to semiconductor product manufacturers and related companies around the world. Contact probes act as inspection terminals in semiconductor product testing and carry electrical signals from the semiconductor test equipment to the semiconductor product. Test sockets are inspection jigs used for final inspection after semiconductor product assembly in the back-end semiconductor manufacturing process. The inspection range includes narrow-pitch units with a pitch of 200 µm or less as well as high-frequency measurement. The SCP Series is a Microcontactor contact probe for semiconductor inspection equipment that achieves low resistance through NHK SPRING's unique coiling technology. The HCP Series is a contact probe for semiconductor inspection equipment designed to improve electrical stability. The NIC Series is a contact probe for semiconductor inspection equipment with high-frequency characteristics. The AZT Series is a contact probe for semiconductor inspection equipment focused on improved contact-position accuracy. Microcontactor probe tips can be processed into various shapes to suit semiconductor products, and NHK SPRING can carry out the process from tip-shape design through processing in its own factory while proposing special shapes for customer requirements.
Capabilities and products
- Pogo Pin probes for semiconductor test and burn-in
- fine-pitch RF probe cards
- high-pin-count high-speed probe cards
- WCSP probe cards
- logic and RF test sockets
- high-frequency RF test contactors
- Kelvin test sockets, including strip types
- PoP memory test sockets
- thermal-control test sockets
- snap-on test sockets
- high-current testing solutions
- contact probe tip-shape design and machining
- probe cleaning sheets