At a glance
| Booth | Q6230 |
| Country | TW |
| Product categories | Acoustic Spectroscopy; Electron Spectroscopy for Chemical Analysis (ESCA); Ultrasonic; Acoustical Mi · Line Width; Critical Dimension (CD) Measurement · Microscopes: Optical Microscopes · Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · X-ray; XRF; 3-D X-Ray; LEXES Systems · Deep RIE etching; Dry Etching · Equipment, Nanotechnology Tools · Other |
| Website | www.msscorps.com |
Company profile
Professional material analysis service in Nano-structure analysis. Total solution in Electrical and Physical failure analysis service. Turn-key service for Pilot / Production, Cooperation of development and sale for energy saving & heat dissipation materials. Service item: Materilas Analysis: SEM/ FIB/ TEM IC Circuit Repair / Laser Decap Dopant & Impurity Analysis / Elemental Analysis Failure-site Localization Integrated Service
Exhibits
汎銓董事長柳紀綸提出公司新營運商業模式，挾台日美矽光子專利，將朝「 服務+設備+授權」三軌並進。 汎銓（6830）向光焱提起侵犯矽光子光損偵測設備專利，引發雙方新舊技術爭戰，汎銓今日再以技術架構解析圖，解析其取得台日和美國三地的核心在於「IR OM + IR影像感測器」的裝置組合專利 針對光焱科技(7728)聲明尚未收到「任何法院相關訴訟函件」，汎銓(6830)董事長柳紀綸表示，以IR影像感測器接收矽光子的光訊號是公司專利，公司已在3月25日早上正式向智慧財產及商業法院提起民事訴訟，此案已進入司法程序，希望光焱科技積極面對法律問題，至於相關事實與法律爭點，將依法由法院審理並作出最終判斷。 今年在12廠區及埃米世代製程材料分析、AI客戶專區、矽光子和全球布局等4大動能驅動下，2026年將會是豐收的一年，業績成長目標50%，並可望迎來「年年豐收」的營運榮景。
Capabilities and products
- IC circuit repair and laser decap
- SEM, FIB and TEM materials analysis
- dopant and impurity analysis
- electrical and physical failure analysis service
- elemental analysis
- failure-site localization integrated service
- nano-structure material analysis service