At a glance
| Booth | I2129 |
| Country | TW |
| Product categories | Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · X-ray; XRF; 3-D X-Ray; LEXES Systems · Analytical Instrumentation Mixtures · Materials, Nanotechnology · Manufacturing Process Support and Development · Test Services or Consulting · Wafer Fab Operations and Design · Wafer Handling · Other |
| Website | www.malvernpanalytical.com/tw |
Company profile
Malvern Panalytical provides world-leading analytical technologies spanning structural, elemental, and surface characterization for semiconductor development. With more than 92,000 instruments installed worldwide, its solutions enable leading semiconductor companies to optimize materials, ensure process control, and accelerate R&D through precise measurements, trusted data, and deep application expertise. Its integrated portfolio supports smarter decisions and sustainable progress in advanced electronics and next-generation manufacturing.
Capabilities and products
- elemental characterization technologies for semiconductors
- precise semiconductor materials measurement
- semiconductor process-control measurement data
- structural characterization technologies for semiconductors
- surface characterization technologies for semiconductors