Omni Matcher · SEMICON Taiwan 2026 · Exhibitor List

JEOL Ltd.

Exhibitor at SEMICON Taiwan 2026 · Booth K2160

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At a glance

BoothK2160
CountryJP
Websitewww.jeol.com

Company profile

Microscope for Semiconductor Inspection (TEM) Microscope for Semiconductor Inspection (SEM) Within the field of semiconductors, new materials such as SiC and GaN,advanced transistor structures, and cutting-edge 3D packaging technologies are receiving a significant attention for achieving lower power consumption and higher performance. To ensure high manufacturing yield and device reliability, precise characterization techniques and the appropriate selection of preprocessing and analytical instruments are essential. This page introduces various analytical instruments and application continue to advance in sophistication. Cryo electron microscope, whose resolution can even observe inside of biomolecules, molecular structure analysis instruments such as electron diffraction, nuclear magnetic resonance, mass spectrometry, that support molecular biology and drug discovery. Please be reminded that these pages are not intended to provide the general public with information about the products. Electron microscopes, nuclear magnetic resonance spectrometers, mass spectrometers that are utilized in scientific fields are introduced. The electron beam lithography system, electron microscopes that are utilized in semiconductor industries are introduced. The electron beam sources, plasma sources that are utilized in thin-film formation, and material processing as well as 3D printer are introduced. Clinical chemistry analyzer, rack handler, the laboratory information system are introduced. Ultra-fast analysis of protein 3D structures ― preparation of a sample for cryo-EM in 10 minutes ― Laboratory of Structure and Function Analysis of Biomolecules Graduate School of Pharmaceutical Sciences, The University of Osaka A museum allowing visitors to experience electron microscopes, with smartphone-like operation

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