At a glance
| Booth | I2406 |
| Country | TW |
| Website | www.hsopto.com/products/6/1.htm |
Company profile
HIROSE OPTO CO., LTD. was established in 2014 with investment from 大陸武漢精測電子集團, and its factory is located in Sanxia District, New Taipei City. The company carries forward deep AOI (automatic optical inspection) capability and extensive experience accumulated over the past ten-plus years in production processes across technology and emerging industries. It brings together professionals from the optical-inspection-equipment field and organizes that specialist expertise into a team focused on AOI equipment development and manufacturing. HIROSE OPTO CO., LTD. identifies itself as a professional supplier of automatic optical inspection equipment and also lists semiconductor metrology equipment within its product scope. In the TFT-LCD industry, its AOI equipment supports the Array, CF, PI, ODF, and Module stages, giving the company experience across multiple production steps rather than only one part of the display process. The company provides products suited to the needs of those TFT-LCD process stages and uses AOI to support quality control for its customers. Its AOI work in TFT-LCD established a foundation on which the company increased research and development investment and widened the application range of its products. That expanded portfolio includes FPD AOI, Micro/Mini LED AOI, Micro OLED AOI, and semiconductor metrology equipment. The combination of display-process AOI experience, optical-inspection specialists, and semiconductor metrology products gives HIROSE OPTO CO., LTD. a product base spanning both display manufacturing inspection and semiconductor measurement. In TFT-LCD production, the company states that its products have supported customer quality control across the listed process stages and have received consistent favorable evaluations from major-factory customers.
Exhibits
For semiconductor applications, HIROSE OPTO CO., LTD. offers the automatic wafer optical inspection system identified as 自動晶圓光學檢測 WAFER AOI. The WAFER AOI is an automatic inspection machine used to determine whether wafers pass or fail during front-end wafer processing. Its defect-inspection system is designed to detect Pattern loss after processing as well as contamination and scratches on the wafer. The same WAFER AOI inspection scope includes Pin Hole, bump defects, and Particle defects. Surface-condition abnormalities are also included in the defect-detection coverage, extending the inspection beyond only discrete particle or pattern defects. By combining automated pass-or-fail judgement with the listed defect categories, the WAFER AOI is intended to respond to customer requirements for process quality and efficiency in front-end wafer manufacturing. The WAFER AOI therefore extends HIROSE OPTO CO., LTD.'s AOI experience from display-process inspection into semiconductor front-end wafer inspection and defect detection.
Capabilities and products
- automatic optical inspection (AOI) equipment manufacturing
- TFT-LCD multi-process AOI inspection
- FPD AOI inspection equipment
- Micro/Mini LED AOI inspection equipment
- Micro OLED AOI inspection equipment
- semiconductor metrology equipment
- front-end wafer automatic optical defect inspection