At a glance
| Booth | I2006 |
| Country | TW |
| Website | expo.semi.org/taiwan2026/public/eBooth.aspx?BoothID=652089 |
Company profile
GAIN-TEK SEMICONDUCTOR MATERIAL CO., LTD., also presented as Gain-Tek Corporation / 研德企業有限公司, is a Taiwan supplier and manufacturer of materials and measurement products for semiconductor packaging and testing. Founded in 1997, the company focuses on Sensofar, confocal microscopes, white-light interferometers, and major materials used by semiconductor packaging and test plants. Sensofar appointed Gain-Tek as its exclusive general agent in Taiwan to serve precision-measurement requirements across the semiconductor front end, middle end, and back end. The material-supply side includes IC packaging carrier boards, test wafers, wafer frames, and BASF thermal caps, combining agency functions with manufacturing and distribution for packaging and test operations. Its metrology business addresses semiconductor and adjacent precision industries with optical measurement technologies including 3D profilometry, confocal measurement, and white-light-interferometry-related products. The company therefore combines packaging/test consumables and carrier materials with precision-metrology equipment and Taiwan distribution support for process-development and production-measurement needs.
Exhibits
Packaging and test materials include IC packaging carrier boards, test wafers, wafer frames, and BASF thermal caps, while S neox is identified as a 3D optical profilometer. For PCB, semiconductor, panel, precision-mold, passive-component, AI, and CPO optical-module industries, Gain-Tek provides measurement-machine options for height, roughness, and R-value requirements from millimeter through micrometer to nanometer scales. The 3D sensor head is designed for production environments where vibration or corrosive materials can make measurement difficult, with optical components that contain no moving parts and a sealed sensor head that prevents debris and particles from entering. Beyond semiconductor EFEM applications, the company offers long-travel customization for PCB or panel customers, extending the measurement platform to large-range dimensional requirements. Smart 2 combines interferometric and confocal measurement in one head and is intended for surface measurement when customers require high lateral resolution, accuracy, and repeatability. The combination of S neox 3D optical profilometry and Smart 2's interferometric plus confocal approach gives the metrology range options for both 3D surface characterization and demanding surface-measurement tasks. The packaging/test material range, wafer-frame supply, test-wafer supply, BASF thermal-cap supply, and Taiwan distribution of Sensofar equipment together connect consumables and precision measurement within semiconductor front-, middle-, and back-end support.
Capabilities and products
- millimeter-to-nanometer height, roughness and R-value measurement
- sealed 3D optical sensor heads
- custom large-travel measurement for PCB/panel applications
- interferometric + confocal measurement heads
- 3D optical profilometer supply (S neox)