At a glance
| Booth | I2924 |
| Country | TW |
| Product categories | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Die Inspection; Die Shear · Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr · Package Inspection; Lead Scanners · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · Bumping Systems · FPD Test; Measurement; Repair Equipment · Linear Test Systems · Logic Test Systems · Package Test Systems · CAM or CIM - Computer Aided Manuf'g; Computer Integrated Manuf'g · Test Programs · Yield Mgmt; Process Control Software |
| Website | www.favite.com/?doing_wp_cron=1614320302.9542040824890136718750 |
Company profile
FAVITE was established in 2000 and was listed on the Taiwan Stock Exchange in January 2008. Over the years, we have continued to attach importance to R&D and patent establish, and have made excellent sales results in the TFT LCD/LTPS /AMOLED display industry. Recently FAVITE has started stepping into Semiconductor, PCB, Mini/Micro LED and other professional fields, providing customers automatic optical inspection (AOI) with high precision and quality as a complete solution for defect detection and yield monitoring on the factory production line. 1. TFT-LCD/OLED/Mini & Micro LED AOI 2. Auto Image Capture Machine、CDOL Measurement Equipment 3. FOPLP RDL AOI、 Customized AOI for PCB 4. CIS AOI、Post Dicing AOI 5. Multi Function Auto OM(HORUS-2000) 6. Customized AOI Solution
Capabilities and products
- CIS AOI
- FOPLP RDL AOI
- TFT-LCD, OLED, Mini LED and Micro LED AOI
- automatic optical inspection (AOI) for defect detection and yield monitoring
- customized AOI for PCB
- post-dicing AOI