基本資料
| 攤位 | I2924 |
| 國別 | TW |
| 產品分類 | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Die Inspection; Die Shear · Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr · Package Inspection; Lead Scanners · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · Bumping Systems · FPD Test; Measurement; Repair Equipment · Linear Test Systems · Logic Test Systems · Package Test Systems · CAM or CIM - Computer Aided Manuf'g; Computer Integrated Manuf'g · Test Programs · Yield Mgmt; Process Control Software |
| 網站 | www.favite.com/?doing_wp_cron=1614320302.9542040824890136718750 |
公司簡介
FAVITE 成立於 2000 年，並於 2008 年 1 月在台灣證券交易所掛牌上市。多年來，我們持續重視研發與專利布局，在 TFT LCD/LTPS/AMOLED 顯示產業締造優異的銷售成績。近期 FAVITE 開始跨足半導體、PCB、Mini/Micro LED 等專業領域，為客戶提供高精度、高品質的自動光學檢測（AOI），作為工廠產線上缺陷檢測與良率監控的完整解決方案。1. TFT-LCD/OLED/Mini & Micro LED AOI 2. Auto Image Capture Machine、CDOL Measurement Equipment 3. FOPLP RDL AOI、Customized AOI for PCB 4. CIS AOI、Post Dicing AOI 5. Multi Function Auto OM(HORUS-2000) 6. 客製化 AOI 解決方案
能力與產品項目
- CIS AOI
- FOPLP RDL AOI
- PCB 客製化 AOI
- TFT-LCD、OLED、Mini LED 與 Micro LED AOI
- 切割後 AOI
- 用於缺陷檢測與良率監控的 automatic optical inspection (AOI)