At a glance
| Booth | I2923 |
| Country | TW |
| Product categories | PV: Cells · Die Inspection; Die Shear · Package Inspection; Lead Scanners · Cells · Inspection and Metrology · Integration and Automation · Thin Film · Optical Test Systems · Package Test Systems · Parametric Test Systems · System on a Chip (SOC); Mixed Signal Test Systems · Materials, Nanotechnology · Gases & Liquid Chemicals · Sensors · Cameras - Still; CCD; Video & Monitors · Calibration & Reference Standards · Certification; Compliance; Independent Laboratories · Flat Panel Display (FPD) Design & Manufacturing · Nanotechnology Intellectual Property Development; Research · Package Materials; Interconnect; Subcomponent; Subassembly Design Services · Product Development; Software Design; Product Lifecycle Management · Software Programming; Software Development |
| Website | enlitechnology.com |
Company profile
ENLI TECHNOLOGY CO., LTD., also branded Enlitech, is a Taiwan provider of artificial light source, spectral analysis and optical sensor testing solutions. Enlitech was founded in March 2009. Its core technologies include artificial light sources and spectral analysis, and its four main product markets are image sensor test solutions, advanced photodetector test systems, quantum efficiency test solutions and various light simulators. Its served industries include semiconductor, materials research, aerospace, automotive, electronic components and photovoltaics. Its product areas cover semiconductor testing solutions and scientific research instruments, including semiconductor testing and silicon photonics measurement. Enlitech's relevant capabilities are optical, spectral and sensor-characterization systems for wafers, image sensors, SiPh devices and related semiconductor photonics applications.
Capabilities and products
- advanced photodetector test systems
- artificial light source systems
- dToF photodetector testing
- image sensor test solutions
- light simulators
- optical sensor testing solutions
- quantum efficiency test solutions
- silicon photonics measurement systems
- spectral analysis systems
- wafer-level image sensor characterization