At a glance
Company profile
ENLI TECHNOLOGY CO., LTD., also branded Enlitech, is a Taiwan provider of artificial light source, spectral analysis, and optical sensor testing solutions. Its core technologies include artificial light sources and spectral analysis, with product markets covering image sensor test solutions, advanced photodetector test systems, quantum efficiency test solutions, and various light simulators. It serves industries including semiconductor, materials research, aerospace, automotive, electronic components, and photovoltaics. Its product areas include semiconductor testing solutions and silicon photonics measurement. Its wafer-level silicon-photonics testing solutions include defect characterization using hyperspectral imaging and a platform delivering over 30 dBm (1 W) output power.
Exhibits
Night Jar is a next-generation SiPh solution that provides accurate, efficient wafer-level optical loss testing for WAT, CP, and FT and integrates mainstream probers to accelerate design verification, shorten cycles, and ensure quality for PIC/EIC SOIC mass production. The QFLS-Maper delivers QFLS maps in 3 seconds and predicts material efficiency in 2 minutes for rapid evaluation of photovoltaic material potential. The SS-LED220EX is a large-area, Class A++ tunable-spectrum LED solar simulator with full-spectrum coverage extending to 1800 nm and quantum efficiency/EQE/IQE/IPCE/SR testing capabilities for PV and solar-cell devices. PD-QE provides precise EQE and IV measurements with <1% light source instability. For wafer-level silicon photonics testing, one platform precisely locates and characterizes defects using hyperspectral imaging for location, classification, and quantification, while another delivers over 30 dBm (1 W) output power, surpassing the conventional 26 dBm limitation.
Capabilities and products
- silicon-photonics wafer WAT, CP and FT test systems
- hyperspectral defect localization and quantitative analysis for silicon photonics
- optical test upgrades for electrical probe stations
- silicon-photonics PCM optoelectrical parameter acceptance testing
- wafer-level KGD screening for silicon photonics
- silicon-photonics insertion-loss measurement
- silicon-photonics return-loss measurement
- silicon-photonics polarization-dependent loss measurement
- waveguide propagation-loss measurement
- optical-link crosstalk diagnosis
- silicon-photonics wafer defect-map generation
- submicron automated GC and EC optical coupling
- simultaneous O-to-O and O-to-E measurement
- temperature-controlled silicon-photonics testing from -40°C to +125°C
- 1310nm continuous-wave laser PIC burn-in testing
- PIC optical damage-threshold measurement
- PIC insertion-loss-versus-time and long-term reliability measurement
- full-Poincaré-sphere polarization-state control
- nondestructive optical inspection of CMOS image sensors
- full-spectrum quantum-efficiency and spectral-response analysis of image sensors
- image-sensor system-gain measurement
- image-sensor sensitivity analysis
- image-sensor dynamic-range measurement
- image-sensor dark-noise and signal-to-noise ratio analysis
- image-sensor saturation-capacity analysis
- image-sensor linearity-error evaluation
- image-sensor dark-signal and photoresponse nonuniformity testing
- CMOS sensor chief-ray-angle CRA measurement
- inspection of under-display fingerprint TFT imaging modules
- integrated SPAD single-photon avalanche diode test systems
- SPAD full-spectrum photon-detection probability testing
- SPAD dark-count and breakdown-voltage measurement
- SPAD timing-jitter and afterpulsing analysis
- full-spectrum quantum-efficiency testing of micrometer-scale photodetectors
- photodetector spectral-response measurement
- photodetector NEP and D* spectral analysis
- photodetector frequency-noise analysis
- photodetector flicker, thermal and shot-noise analysis
- illuminated and dark I-V testing of photodetectors
- three- and four-terminal Photo-FET testing
- custom probe-station integration for photodetector testing
- constant-photon-flux spectral testing
- light sources with custom beam sizes and intensities
- photodetector spectral measurement and glovebox integration
- photocurrent measurement with 10^-14 A resolution
- photodetector testing at bias voltages from 20 V to 200 V
- characterization of perovskite, organic and quantum-dot photodetectors
- photodetector angular-response test systems
- automotive-camera test light sources with 150 dB dynamic range
- LED flicker simulators
- temperature-controlled automotive-camera testing from -40°C to 80°C
- calibration light sources for ALS ambient light sensors
- photodetector light-intensity response linearity calibration
- ambient-light interference simulation for under-display fingerprint sensors and LiDAR
- custom AM1.5G solar simulators
- AM0 space solar simulators
- custom light-proof and electromagnetically shielded test enclosures
- quasi-Fermi-level splitting QFLS mapping and material-efficiency prediction
- large-area tunable-spectrum LED solar simulators
- silicon photonics coupling efficiency measurement
- silicon photonics coupling-angle response measurement
- optical link loss measurement
- silicon photonics frequency response and bandwidth measurement
- optical link latency and dispersion measurement
- integrated wafer-level optoelectronic testing for CIS and ALS
- temperature-controlled optical sensor wafer testing
- integrated wafer DC, CV and RF measurement
- optical sensor wafer mapping and yield checking
- ToF sensor testing
- LiDAR sensor testing
- starlight-level low-light sensor test illuminators
- high-collimation light sources for PDAF testing
- ATE-integrated large-area uniform illuminators
- computer-controlled rotary and XY translation sample stages
- custom optical sensor test fixtures
- 300nm~1100nm full-spectrum irradiance meters
- light source illuminance and CIE color coordinate analysis
- solar simulator spectral measurement and classification
- indoor photovoltaic light source evaluation and Jsc (EQE) calculation
- solar cell EQE, IQE, IPCE and spectral response measurement
- tandem and multijunction solar cell testing
- solar cell reflectance measurement
- solar cell bandgap analysis
- solar cell spectral mismatch factor calculation and correction
- measurement for bulk-heterojunction phase separation studies
- solar cell Jsc, Voc and FF efficiency loss analysis
- light spot locating and observation tools for darkrooms
- material PL and PLQY measurement systems
- in situ time-dependent PL spectral analysis
- LED and laser excitation light sources for photoluminescence
- high-sensitivity electroluminescence efficiency test systems
- voltage-dependent electroluminescence spectrum measurement
- reference cells for solar simulator calibration
- solar reference cell recalibration services
- photovoltaic I-V measurement and illumination control software
- solar cell Sun-Voc testing
- solar cell ideality factor measurement and fitting
- glovebox integration of solar cell quantum efficiency systems and solar simulators
- measurement for CIS microlens design verification