At a glance
| Booth | J2634 |
| Country | KR |
| Website | www.di.co.kr |
Company profile
DI Corporation positions itself as a semiconductor test-equipment manufacturer providing tester solutions centered on challenge, creation and innovation. The company states that it has accumulated competency in semiconductor testing equipment and manufactures and supplies multiple kinds of semiconductor-related equipment. Its product families include Multi Flexibility Tester systems, Test Burn-In Testers, Monitoring Burn-In Testers, LED Burn-In & Test Systems, Logic Burn-In Testers, MLCC Burn-In Testers and Memory & Logic Burn-In Boards. Named tester models include DM1900ENGR and DM1900N/N2 in the Multi Flexibility Tester family; AF8862C7H3 and DM8827C7H3 in Test Burn-In Tester; DM1400 and DM1600C in Monitoring Burn-In Tester; and DP4100 in LED Burn-In & Test System. The Logic Burn-In Tester range lists DL1100A, DL800F, DL601H V16, DL602A, DL602AC, DL612AM and DL601H2M, while DQ410N is listed under MLCC Burn-In Tester. Burn-in board offerings include boards for memory devices and boards for logic devices. DI selected the ladybird as its corporate symbol and explains the choice by linking the insect's usefulness in preying on crop-damaging insects with its long-standing association with good fortune. The company describes its direction as using its accumulated semiconductor-test-equipment capabilities to pursue a global role in the sector and to continue manufacturing and supplying semiconductor-related equipment. Its stated development approach emphasizes taking on challenges and pursuing innovation while building semiconductor testing equipment.
Exhibits
AF8652 is described as a high-precision, high-performance memory IC Test & Burn-in Solution with compact dimensions, additional capacity and additional I/O pins. DI states that AF8652 is designed to improve productivity in both high-temperature and low-temperature operation. DM3500 is a wafer-level burn-in system intended for wafer business and manufacturing of K.G.D. (Known Good Die). The company states that DM3500 can increase the yield of DDP, MCP and SIP while emphasizing cost effectiveness. Burn-in testers and burn-in boards are identified as flagship semiconductor inspection equipment that apply electrical signals and high- or low-temperature stress-test processes to wafers in wafer state or to packaged chips. Those burn-in processes are used to verify semiconductor-function durability and reliability. DI attributes several production effects to the burn-in equipment: improved semiconductor manufacturing yield, shorter package burn-in time and earlier assurance of product reliability. The company also states that the equipment can perform some Main Tester functions, shorten lead time and reduce production cost through equipment-substitution effects. DI's broader product range complements these memory and wafer-level burn-in systems with monitoring, logic, LED and MLCC burn-in testers plus memory and logic burn-in boards.
Capabilities and products
- Memory IC test and burn-in systems
- Wafer-level burn-in systems
- Monitoring burn-in testers
- LED burn-in and test systems
- Logic IC burn-in testers
- MLCC burn-in testers
- Memory and logic IC burn-in boards
- Multifunction semiconductor testers