At a glance
| Booth | S7646 |
| Country | TW |
| Website | www.deantech.com.tw |
Company profile
Dean Tech Co., Ltd is the officially authorized sole agent in Taiwan for Germany's Bruker, handling sales, technical application, and after-sales service for portable, benchtop, floor-standing material-analysis equipment, open micro-area scanning spectrometers, and related analysis systems in Taiwan. The company also represents equipment, semiconductor equipment components, and process solutions from more than ten European, American, and Japanese brands, giving customers access to multiple instrument and component categories through the same technical-support organization. For semiconductor materials and equipment parts, Dean Tech Co., Ltd has practical experience in micro-contamination analysis and in helping customers establish inspection methods, analysis workflows, measurement parameters, and quality-management standards. Its semiconductor experience includes qualified-supplier work with first-tier semiconductor manufacturers and hands-on establishment of analysis and inspection methods intended to improve process stability and yield. Dean Tech Co., Ltd provides process-improvement solutions spanning front-end and back-end operations, including WET Clean, CMP, wafer cleaning, chemical-mechanical polishing, advanced packaging, cleaning, chemical polishing, dicing processes, and yield improvement for both advanced and mature processes. For semiconductor equipment, the company can provide customized component design, manufacturing, optimization, and verification according to customer requirements, linking equipment-part work with process-performance and quality-improvement needs. Its fluid-engineering services include fluid improvement, computational fluid dynamics analysis, mixing-efficiency optimization, flow-path design, and fluid simulation for semiconductor, chemical, and precision-manufacturing applications. Through fluid-mechanics analysis and customized design, these services are used to improve flow-field uniformity, reduce pressure drop, raise mixing efficiency, and develop fluid components and solutions for special applications. Dean Tech Co., Ltd also develops smart-manufacturing and artificial-intelligence applications, including AI visual recognition, model training, data analysis, automated inspection, and neuromorphic-computing services under its SEMIBro activity. The company applies AI to material analysis, quality management, and semiconductor-process optimization so customers can build smart analysis workflows and increase the degree of automation in manufacturing environments. Its material and elemental-analysis scope covers surface residual-contamination analysis, organic and inorganic material analysis, micro-contamination inspection, failure analysis, material-characterization research, and process improvement. Technical support includes a team of doctorate-level specialists from Bruker and professional technical personnel certified or authorized by the original manufacturer, with services covering technical consulting, education and training, application development, material and process analysis, and after-sales support. The company states Innovation, Quality, and Professionalism as its operating principles and combines analytical technology, semiconductor-process experience, fluid-engineering design, and artificial-intelligence applications in its work with customers. Dean Tech Co., Ltd identifies theta tech co., ltd. as a partner specializing in non-destructive XRF analysis, FTIR, NIR, Raman spectroscopy, X-ray imaging, chemical analysis, and hazardous-substance analysis, with instrument-analysis solutions for research and development, process, and quality-assurance stages. Dean Tech Co., Ltd states that it is the sole global shareholder of Japan SIO Co., Ltd.
Exhibits
Dean Tech Co., Ltd lists SEMIBro neuromorphic computing, Bruker next-generation Titan, SIO MIXER nanobubble generation equipment, Bruker TRACER 5g, Bruker M4 Tornado PLUS, and Bruker M6 Jetstream among its named products and systems. Its broader analytical-instrument range includes X-ray diffraction, WDXRF, Portable XRF, HHXRF, art and archaeological conservation analysis instruments, Micro XRF, TXRF, FTIR, FTIR microscopes, Raman microscopes, and hyperspectral systems for airborne, laboratory, field, UAV, and industrial applications. The same product range also includes restoration equipment for paintings, paper, and textiles, Extract-All equipment, FLUXANA VANEOX pellet presses and associated tools and consumables, VITRIOX fusion machines, laboratory accessories, and standards. SIO MIXER is presented as a nanobubble-generation device that can be installed without supplying external gas, with the stated purpose of changing liquid characteristics, improving a process, and reducing cost through a relatively simple installation. The SIO solution is described as drawing on fluid-mechanics know-how and patented fluid-optimization and nanobubble designs, with construction options that include multiple grades of steel, PTFE, PFA, and engineering plastics for different equipment requirements. For customized installations, internal structures can be optimized according to a customer's equipment recipe so that original flow and pressure settings remain compatible while the system targets the required bubble concentration, and customized nozzles can be developed for integration at different positions including the water-outlet nozzle. Special configurations are available for flow requirements above 500 LPM, the stated water-pressure range is 1 to 120 bar, and PTFE and PFA configurations are described for chemical, acidic, and alkaline liquid applications. The nanobubble technology is described as providing controllable particle-size ranges for different process requirements, with a stated minimum controllable size of 1 nm and optimization of the average particle-size range according to the application. For validation of nanobubble applications, Dean Tech Co., Ltd states that it uses Malvern NanoSight Pro and Zetasizer instruments and has accumulated thousands of analysis records for comparison work and concentration verification at installation positions. The company notes that concentration readings from nanobubble generators can differ between instrument generations, including stated differences of 3 to 4 times, and therefore recommends the latest NanoSight Pro as the concentration-measurement reference rather than converting measurements from an older NTA platform. Its next-generation nanobubble model is described as exceeding a bubble concentration of 2.5 billion, while an older NTA platform could indicate a converted value of 7 to 10 billion because of the stated inter-generation measurement offset. For semiconductor cleaning, Dean Tech Co., Ltd combines nanobubble-process adjustment with analytical equipment used to evaluate changes in micro-area contamination, and it can also provide combined nanobubble and microbubble generation to use nanobubble penetration together with microbubble stripping and dissolution effects. One analytical application presented by the company is the 2018 Girl in the Spotlight study of skin tones in Johannes Vermeer's Girl with a Pearl Earring, which combined MA-XRF imaging, reflectance imaging spectroscopy, 3D digital microscopy, and paint cross-section analysis. The study describes how Vermeer used light and shadow to construct the face, blended final paint layers into nearly seamless transitions, left a gap between the background and skin to soften the facial outline, and produced details such as eyelashes that are not readily visible to the naked eye. Cross-section work in the study indicates that different grades and qualities of lead white were used in flesh paint, with different hydrocerussite to cerussite ratios and particle sizes, and it identified newly formed lead compounds including lead soaps and K2Pb(SO4)2 associated with red-lake pigment. Vermeer developed his technique for rendering soft flesh tones around 1665, and this soft handling is one of the principal reasons used to date Girl with a Pearl Earring to about 1665. MA-XRF data were collected with a Bruker M6 Jetstream over two areas for a total of 25 hours, followed by a 240x24mm strip at the left side of the face for 19 hours using 50kV, 600μA, a 400μm step, and a 125ms dwell time; detailed facial scanning used a 100μm step and 200ms dwell time. Bruker software collected the data, while PyMca and Datamuncher were used for processing and stitching to generate elemental-distribution maps; MA-XRF was used to examine elements in surface and subsurface paint, while RIS supplied molecular information about pigments. Paint samples from a flesh-tone highlight and a shadow area were examined by multiple cross-section techniques to obtain information about layer condition and thickness, confirm pigments inferred by MA-XRF, and investigate lead white in underlying and surface layers as well as lead-containing products formed through aging and degradation. The study describes a three-dimensional facial surface built with underlying paint, a light-facing right side and shadowed left side, subtle transitions across the cheeks, soft middle tones around the eyes and nose, multiple stages of flesh-tone reinforcement with drying between stages, and a densely applied milky underlayer visible at 40-times magnification in illuminated areas. Pb-L mapping was used to visualize lead in surface and deeper paint layers, and after image adjustment the bright side of the face showed a higher Pb-L signal than the shadow side; higher Fe signals were observed around the eyes, nose, cheek, and neck shadows, while Pb-M mapping indicated lead white across light, middle, and shadow flesh tones. Pb-M and Hg-L maps indicate that pink flesh tones contain both lead white and vermilion, while Fe-K, Pb-M, and Hg-L results support earth pigments, lead white, and a small amount of vermilion in thin upper layers of middle and shadow tones; K and Ca signals are discussed as possibly related to an organic lake-pigment matrix. Although the visible image gives the impression of smooth gradation, MA-XRF evidence distinguishes underpaint and different finishing pigments for light, middle, and shadow areas, indicating that separate color zones were systematically built from an early stage of the painting. After the underlayer dried, the final smooth paint layer varied in thickness and composition, with a relatively thicker upper layer in bright areas and thinner paint in middle and shadow regions that allowed the underpaint to participate in the final color; cheek details show a subtle blend from bright to cool to shadowed pink-brown tones. A strong iron-rich contour appears along the bright side of the face next to the dark background, and high-resolution MA-XRF overlays using Cu-K as a background marker and Hg-L as a face marker show that the background paint and the flesh-color layer do not touch, leaving a distinct gap consistent with the Fe map. Named application topics include cross-generation NTA measurement error, fluorine residue on semiconductor parts, semiconductor contamination analysis, coating-thickness measurement with HHXRF, and hyperspectral imaging for mineral identification.
Capabilities and products
- authorized Taiwan sole agent for Bruker material-analysis equipment
- semiconductor micro-contamination inspection-method development
- WET Clean/CMP/wafer-cleaning process improvement
- custom semiconductor-equipment component design, manufacturing and validation
- CFD flow-field analysis and fluid simulation
- AI visual recognition and automated inspection
- surface-residue and failure analysis for materials
- SIO MIXER nanobubble generation equipment
- SIO MIXER 1–120 bar chemical, acidic and alkaline liquid applications
- nanobubble particle-size control down to 1 nm
- NanoSight Pro & Zetasizer nanobubble concentration verification
- combined nanobubble and microbubble generation