At a glance
| Booth | N1076 |
| Country | TW |
| Product categories | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Die Inspection; Die Shear · Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Flat; Notch Finding System · Line Width; Critical Dimension (CD) Measurement · Plate Inspection Equipment · Inspection and Metrology · Integration and Automation · Optical Test Systems · Package Test Systems |
| Website | www.cmi-tw.com.tw |
Company profile
Since 1995, CMIt company has been delivered manufacturing automation of surface inspection and 3D measurement equipment‘s for compound Semiconductor / Semi / microLED / mmLED / LED. We solve complex defects and challenging features of wafer/die, to achieve great benefits for our clients with the best CP Value and thoughtful services. CMIt’s surface inspection equipment includes different series which provide great optical performance, high reliability and great WPH. We combine multiple solutions from optics, metrology and automation system to make operating easier and faster. Our R&D group are over 50% of the total employees, which shows our great ambition to conquer all current difficulties and great wishes to grow with our clients.
Capabilities and products
- 3D measurement equipment for wafer and die features
- metrology and automation systems for inspection equipment
- optical surface inspection systems
- surface inspection equipment for compound semiconductor, Semi, microLED, mmLED, and LED
- wafer and die defect inspection for complex defects