At a glance
| Booth | N1282 |
| Country | TW |
| Product categories | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Microscopes: Atomic Force Microscopes (AFM) · Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes · Microscopes: Optical Microscopes · Stress; Refractive Index; Reflectivity & Conductivity Measurement · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · Wire Bonding Inspection; Test · Equipment, Nanotechnology Tools · Inspection and Metrology · Optical Test Systems · Wireless, non-contact Test Systems · Materials, Nanotechnology |
| Website | www.Bruker.com/Nano |
Company profile
Bruker Nano Surfaces provides critical surface analysis instruments for research and production. Our broad range of application focused instruments from AFM, 3D Optical Profilers to Nano-Mechanical Testers and Tribometers support R&D, process development and manufacturing needs with good repeatability and accuracy in back-end, front-end Semiconductor, MEMS manufacturing and IC packaging. Whatever your surface measurement and surface analysis needs, Bruker has a high-performance solution for you. Visit www.Bruker.com/Nano to learn more about Bruker AFM and 3D Optical Solutions.
Capabilities and products
- 3D Optical Profilers for surface measurement
- AFM surface analysis instruments
- Nano-Mechanical Testers
- Tribometers
- surface analysis for IC packaging
- surface analysis for MEMS manufacturing
- surface analysis for front-end and back-end semiconductor manufacturing