At a glance
| Booth | N1282 |
| Country | TW |
| Website | www.Bruker.com/Nano |
Company profile
Bruker Taiwan Co., Ltd provides surface-analysis instrumentation for research and production through Bruker Nano Surfaces, including AFMs, 3D Optical Profilers, Nano-Mechanical Testers, and Tribometers. These application-focused instruments support R&D, process development, and manufacturing with repeatability and accuracy across front-end and back-end semiconductor production, MEMS manufacturing, and IC packaging. Across Bruker's broader organization, more than 11,000 employees are supported by 2,000 employees dedicated to R&D, 15 major manufacturing sites globally, and more than 5,000 patents pending or granted. Bruker provides scientific instruments and analytical solutions for detecting, measuring, and visualizing structural properties of chemical, biological, and industrial samples at microscopic, molecular, and cellular levels. Its customer markets span life and materials science, biopharma, applied research, microbiology, diagnostics, nanotechnology, pharmaceuticals, clinical research, biotechnology, cell biology, and in-vitro diagnostics. The broader platform portfolio includes magnetic resonance, mass spectrometry, gas and liquid chromatography, X-ray, microscopy, metrology, molecular spectroscopy, automation, and software solutions. Bruker is headquartered in Billerica, Massachusetts and supports customers globally through technical and manufacturing centers in Europe and North America together with a worldwide sales and support network. The organization has four operating segments: Bruker BioSpin Group, Bruker CALID Group, Bruker Scientific Instruments (BSI) NANO Segment, and Bruker Energy & Supercon Technologies (BEST), with BSI Life Science, BSI NANO, and BEST as three reportable segments. Bruker BioSpin designs, manufactures, and distributes magnetic-resonance and preclinical-imaging instruments including NMR and EPR spectrometers and MRI, PET, SPECT, CT, Optical, and MPI imaging systems, together with software and automation tools. BioSpin customers in academic, government, industrial, and pharmaceutical sectors use these technologies for structural biology, drug discovery, disease research, metabolomics, and advanced materials analysis. Bruker CALID comprises Bruker Daltonics and Bruker Optics; Daltonics supplies MALDI-TOF, ion-trap mass spectrometry, magnetic-resonance mass spectrometry, and LC-MS technologies, while Bruker Optics supplies infrared and Raman spectroscopy systems including FT-IR and NIR. Bruker Energy & Supercon Technologies produces superconducting wires that have served healthcare, academic, and industrial organizations for more than 50 years, including applications in MRI, advanced materials science, and sustainable energy. Its high-performance superconducting wires can carry up to 100 times the current of conventional copper wires for technologies such as NMR that require high stability and low energy consumption. The BSI Nano Segment includes Bruker AXS, Bruker Nano Analytics, Bruker Nano Surfaces and Metrology, Fluorescence Microscopy, and Canopy Divisions for academic, governmental, life-science, materials, and applied-industry customers. Bruker AXS provides X-ray instruments based on XRF, XRD, and X-ray micro computed tomography together with spark optical-emission spectroscopy systems, while Bruker Nano Analytics supplies EDS, EBSD, micro-CT accessories, micro-XRF, TXRF, and handheld, portable, and mobile XRF instruments. Bruker Nano Surfaces and Metrology combines AFM instrumentation with non-contact nanometer-resolution topography by white-light interferometry and stylus profilometry, and also supplies automated X-ray metrology, automated AFM defect detection, and photomask repair and cleaning equipment for semiconductor process control. Bruker's corporate history includes the establishment of Bruker Physik-AG in Karlsruhe in 1960 after early work in the 1950s identified a need for impulse spectrometers.
Exhibits
Bruker Taiwan Co., Ltd offers tools for surface and materials characterization across semiconductor, materials science, life science, and industrial applications. The portfolio includes atomic force microscopes, nanoIR spectrometers, stylus and optical profilometers, ellipsometry and reflectometry systems, in-situ and stand-alone nanomechanical testers, mechanical and tribological testers, and semiconductor research and manufacturing tools. These instruments support R&D, QA/QC, process monitoring, materials development, and other materials-analysis needs from early-stage research through high-throughput production. Bruker systems are designed for flexibility across surfaces, sample types, and workflows through modular designs, upgrade paths, extensive accessories, and multiple operating modes. Its software platforms combine intuitive interfaces, guided setup, automation tools, and data visualization to support both new analysts and experienced users. Bruker describes decades of in-house surface-analysis development and a catalog with more proprietary technologies than any other provider, with tools shaped around real-world application challenges. Materials-research AFMs use PeakForce Tapping® technology for nanomechanical, nanoelectrical, and nanoelectrochemical research, with Bruker associating this platform family with roughly three peer-reviewed published articles per day. The materials AFM range includes DIMENSION 2D AFM, DIMENSION FASTSCAN AFM, DIMENSION ICON AFM, DIMENSION NEXUS AFM, DIMENSION XR, INNOVA AFM, INNOVA-IRIS AFM, MULTIMODE 8-HR, NANOWIZARD 4XP NANOSCIENCE, NANOWIZARD NANOOPTICS, and NANOWIZARD V NANOSCIENCE. Industrial AFM options include DIMENSION FASTSCAN PRO for automated nanometrology in industrial R&D and DIMENSION HPI AFM for high-volume production environments. BioAFM products include CELLHESION 300, CELLWIZARD STAGE, DIMENSION FASTSCAN BIO, FORCEROBOT 400, NANORACER, NANOWIZARD 4XP BIOSCIENCE, NANOWIZARD V BIOSCIENCE, NANOWIZARD PURE, and ULTRA SPEED 3 for life-science and soft-matter research workflows. For 3D optical and stylus profilometry, Bruker supports non-contact and contact surface-roughness characterization, step-height measurement, and film-stress analysis. Optical-profiler models include CONTOURX-100, CONTOURX-200, CONTOURX-500, CONTOURX-1000, NPFLEX-1000, CONTOURSP, and HD9800+, while stylus profilers include DEKTAK PRO and DEKTAKXTL. Mechanical and tribological characterization is provided through stand-alone and integrated systems for quantitative testing at nano- and microscales. Stand-alone nanomechanical systems include HYSITRON TI 990, HYSITRON TI 980, HYSITRON TI PREMIER II, and HYSITRON TS 77 SELECT. Microscope-integrated systems include HYSITRON BIOSOFT, HYSITRON INTRASPECT 90, HYSITRON INTRASPECT 360, and HYSITRON TS 75, while SEM and TEM systems include HYSITRON PI ENVISION SEM PICOINDENTER, PI 80, PI 89, PI 89 AUTO, and PI 95 TEM PICOINDENTER. Tribology and mechanical-test products include UMT TRIBOLAB, TRIBOLAB CMP for wafer-polishing process and material characterization, and TRIBOLAB HD for brake-friction and particle-emissions studies. Bruker's nanoIR spectrometers correlate chemical composition with nanoscale structure, with products including DIMENSION ICONIR, DIMENSION ICONIR300, NANOIR3, and NANOIR3-S. Ellipsometry and reflectometry systems characterize film thickness and optical properties and include FILMTEK 6000 PAR-SE ROBOTIC, FILMTEK 2000M TSV ROBOTIC, FILMTEK 4000 ROBOTIC, FILMTEK 2000 PAR-SE ROBOTIC, and multiple benchtop FILMTEK configurations. The benchtop FILMTEK range includes FILMTEK 2000 PAR-SE, FILMTEK 2000M, FILMTEK 4000, FILMTEK 2000 SE, FILMTEK SE, and FILMTEK 2000 for patterned or unpatterned thin-film and multilayer measurements. Dimensional-metrology products include µCMM for dimension, position, shape, and roughness with one optical sensor, COBOTS combining optical 3D sensing with collaborative robotics, FOCUSX, and INFINITEFOCUS. Semiconductor research and manufacturing solutions include automated AFM systems such as INSIGHT 300 for fab-ready inline metrology and INSIGHT AFP for CMP profiling and etch-depth metrology. Current in-plane tunneling systems include SMARTPROBER P1 for 300 mm wafer applications in corporate R&D and failure analysis and SMARTPROBER TT for research and development. Mask-repair products include FP-III, NM-VI, and RHAZER-III, while mask and wafer cleaning products include EL-C and WC-2200, a fully automated high-volume non-aqueous CO₂ cryogenic dry-cleaning system. White-light interferometry options include INSIGHT WLI and CONTOURX-1000, and semiconductor stylus profilometry includes DEKTAK XTL for 300 mm QA/QC work. Semiconductor nanomechanical and tribology systems include HYSITRON ATI 8800, HYSITRON TI 990 TRIBOINDENTER, HYSITRON PI 89 AUTO, and TRIBOLAB CMP. Nanoscale property and chemical-characterization systems for semiconductor work include DIMENSION ICONIR, DIMENSION ICONIR300, and DIMENSION FASTSCAN PRO. X-ray metrology for silicon semiconductor includes SIRIUS-RF, SIRIUS-FW, and 7300LSI, while compound-semiconductor metrology includes DELTA-X, QCVELOX-HR, QCVELOX-E, and QC5-R. X-ray defect-inspection products include JVSENSUS-600F, QC-RT, and QC-TT for process-tool qualification and non-visual defect work in high-value substrates. Bruker extends the instrument portfolio with system selection, accessories, training, extended service, upgrades, application support, and support engineers, application scientists, and subject-matter experts focused on customer productivity.
Capabilities and products
- atomic force microscopes (AFM)
- nanoIR nanoscale infrared spectrometers
- stylus and optical profilometry
- ellipsometry and reflectometry
- nanomechanical testing
- mechanical and tribological testing
- surface roughness and step-height measurement
- film stress analysis
- XRF and XRD X-ray analysis instruments
- X-ray µCT instruments
- EDS electron-microscope X-ray analysis
- EBSD electron backscatter diffraction analysis
- automated X-ray semiconductor metrology
- automated AFM defect detection
- photomask repair equipment
- photomask and wafer cleaning equipment
- white-light interferometry metrology systems
- dimension, position, shape and roughness measurement
- X-ray metrology for silicon semiconductors
- X-ray metrology for compound semiconductors
- X-ray defect inspection
- NMR and EPR magnetic-resonance spectrometers
- MALDI-TOF and ITMS mass spectrometers
- MRMS and LC-MS mass spectrometers
- superconducting wire production