At a glance
| Booth | K3184 |
| Country | TW |
| Website | www.amidatec.com/EN |
Company profile
AMIDA Technology,Inc. was established in 2002 around semiconductor test-instrument and system-technology development and builds Power IC testing systems, Mixed Signal IC testing systems, and high-power test systems for semiconductor manufacturers. Its high-power test scope includes MOSFET, IPM, IGBT, SiC, and GaN, while its optical-semiconductor work includes CMOS image-sensor module test solutions for high-throughput inspection of CIS, camera modules, and lenses. The company has also developed VCSEL and LiDAR wafer-measurement systems and TOF test resolution, extending its test and measurement work into optical-sensing devices. AMIDA Technology,Inc. describes a technical team with extensive equipment and system-design experience, customer-service focus, and development work spanning analog IC testing and mixed-signal measurement. The company states that its systems emphasize wide testing range, high stability, fast test speed, strong measurement capability, and cost advantages in equipment of the same grade. AMIDA-3001XP was launched as a second-generation tester intended to reduce test cost while preserving accuracy and stability, increasing test speed, using high-pin-count module design, and adding high-voltage and high-current modules. The latest-generation AMIDA-5000 Tester was launched with improved parallel-test speed and higher-order-chip performance as another milestone in the company's test-system development. AMIDA Technology,Inc. reports more than 2,000 systems installed domestically and more than 200 units at a single customer, and describes complete customer service and close interaction with customers. The company identifies major semiconductor and digital-camera manufacturers throughout Asia among its customer base and positions itself as a long-term strategic partner for electronic testing and measurement in semiconductor and optical industries. Its home offices are located in Taipei's Chung-Ho Far East Century Park, and the company attributes its technical expertise and cost-effective products to more than two decades of ongoing customer-focused research and development. AMIDA Technology,Inc. also states that it provides complete solutions tailored to specific testing and measurement needs, integrating hardware and software, adhering to promised lead times and strict quality requirements, and working with customers to define future needs.
Exhibits
AMIDA ATI-36XP High Power Discrete Tester is a multifunction test system for Power IC devices including MOSFET, IGBT, SiC, GaN, and IPM. AMIDA-5000 is an advanced analog and mixed-signal solution, and the product family is described as combining analog, mixed-signal, logic, and PA testing for engineering verification and mass production. The AMIDA-5000 architecture includes as many as 512 smart multifunction pin structures and 128 stations, supports parallel testing, and can connect to well-known wafer probers and handlers. AMIDA-5000 is intended for high-precision, high-resolution, high-reliability, low-cost test and measurement with an accessible user interface for power-management, mobile-device, analog, mixed-signal, digital IC, and PA applications. AMIDA-3001XP provides more than twice the analog channels per test-system module, increasing parallel-test capacity and reducing channel acquisition and IC-unit test cost. Its built-in real-time protocol detection simplifies test-development complexity and uses high-speed computing capability to shorten test time. AMIDA-3KS provides six board-track slots for analog board channels in the test head and is presented as a cost-optimized tester for consumer power-management ICs and hand-portable product components. AMIDA ATI 600 is a dedicated tester for semiconductor components such as MOSFETs, BJTs, and diodes, using form-based and editable programmable control for accurate and rapid product-parameter measurement in CP, FT, mass-production, and research work. AMIDA-400X is a fully automatic optical-sensor testing system for 100 ns LiDAR chips at the CP station, while the company's wider optical-test work includes VCSEL and LiDAR measurement. AMIDA 2020XP is a dedicated CMOS image-sensor tester for high-throughput mass-production inspection of image lens modules and camera lenses, integrating DC open, short and leakage tests, AC pattern tests, and image tests through a 180-pin high-speed cable. The 2020XP lets users customize measurement requirements for different sensor definitions and is described as meeting testing-time, output, and accuracy requirements after nearly 20 years of mass-production experience. The AMIDA VCSEL Tester is divided into LIV, near-field, and far-field measurement systems and relies on fast, stable current pulses to drive VCSEL laser diodes for optical and electrical characterization. Its current-pulse capabilities include LDPMU at 100 uS pulse width and 20 A, High Speed Pulser-2PD at 10 uS pulse width and 1 A, and a TOF Module at 100 nS pulse width and 10 A. AMIDA ATI-488 is a PCI-interface GPIB card compliant with IEEE 488.1 and IEEE 488.2, supports Windows 95, 98, Me, NT4.0, 2000, and XP with Plug & Play, and provides development support for multiple Windows programming environments plus NI-like commands. The TMU PCB Module is a PCI-based Time Interval Counter with dual-channel input, ARM trigger, and an internal 40-bit counter for measurements including frequency, period, time interval, and pulse width. AWG-50 is a single-channel PCI-based arbitrary waveform generator with built-in digitizer, a 50 MS/s waveform update rate, and up to 4 M byte of waveform memory per channel with 16 M byte optional. The service team offers load-board layout design, programming support, professional analog training, test and measurement consulting, test-chart design, software updates, and FAQ support.
Capabilities and products
- Power IC test systems
- mixed-signal IC test systems
- high-power testing for MOSFET/IPM/IGBT/SiC/GaN
- CMOS image-sensor module testing
- VCSEL/LiDAR wafer measurement
- 100 ns LiDAR chip CP testing