At a glance
| Booth | K3290 |
| Country | TW |
| Website | aem.com.sg |
Company profile
AEM Singapore Pte. Ltd. provides semiconductor and electronics test solutions across wafer and chip handling, process automation and mixed-signal testing, with additional development in optoelectronics, data analytics and machine-learning software. Its Test Cell Solutions portfolio includes System Level Test Handlers, Final Test Handlers, Multi-Purpose Probers, High Power Active Thermal Control, Test Interface Boards, Change Kits and Sockets. Its Instrumentation Solutions include Mixed Signal ATE and Test & Measurement Instruments. AEM Singapore Pte. Ltd. states a vision of a Zero Failure World and a mission to provide comprehensive semiconductor and electronics test solutions based on technologies, processes and customer support. The company integrates test, smart automation and handling with design and manufacturing processes so that real-time data can be used to optimize test coverage, product reliability and scalability. With a global network, localized support and full-stack test capabilities, AEM Singapore Pte. Ltd. works with customers to develop integrated test flows intended to accelerate delivery cycles and improve product quality. Its approach includes understanding customer needs, identifying opportunities, orchestrating complex test solutions and applying engineering expertise to optimize test processes. The company also lists Handling Solutions, ATE Solutions, Test Interface Solutions and Precision Cable Test within its product scope, together with Contract Manufacturing and Machining Service offerings. Precision Cable Test solutions are described for laboratory, manufacturing and field-use applications, while ATE Solutions combine test-system hardware, software and support. AEM Singapore Pte. Ltd. emphasizes customized, application-specific testing and customer partnerships as part of its response to changing advanced-manufacturing requirements. The company’s headquarters is in Singapore, and it has a global presence across Asia, Europe and the United States. Manufacturing plants are located in Singapore, Malaysia, Indonesia, China, Vietnam, Korea and Finland, supported by a global network of engineering support, sales offices, associates and distributors.
Exhibits
The AMPS-High Parallel Test Cell Series is a high-power, high-throughput automated high-parallel test system for advanced semiconductor devices, using AEM’s patented PiXLTM intelligent thermal-management technology for precise scalable thermal control. AMPS High Parallel Test Cell performs accelerated high-voltage stress testing using patented intelligent thermal control and power-management capabilities. The fully automated modular AMPS architecture can simultaneously stress-test hundreds of devices in parallel. Its patented Intelligent Thermal Control, ITC, is scalable to >2KW per device and provides precision thermal control for stability during test. Application-specific test instruments can be optimized for customer requirements, while individual device control supports asynchronous operation, on-the-fly pattern changes and high system utilization. AEM Singapore Pte. Ltd. describes AMPS as a scalable approach intended to reduce test time while increasing overall test coverage and lowering cost of test for AI processors, high-performance compute devices and advanced heterogeneous packages with chiplets. The CWP system is designed for wafer-level testing of cryogenic quantum devices, electronics and detectors, probing wafers up to 12" at sub-2K temperatures. CWP is described as enabling sample characterization with throughput up to 100 times faster than commonly used cryogenic chambers and supporting volume probing of entire 300mm wafers. ATOM-IC Handler is a benchtop handler for engineering test floors and development operations, designed for flexibility with low cost and maintenance requirements. NESTEK SOCKET is used together with NESTEK PIN as a test interface for inspecting electrical defects, characteristics and functions. NESTEK products support logic-test solutions such as PoPs and multi-parallel test sockets and are used for inspection or testing of HPC, Logic, PMIC, RF, MEMORY, camera modules and display modules. NESTEK PIN can be produced with a barrel outer diameter of ø0.15~7.0 and a length of 1.5~93.0mm. The pin is used for O/S (Open, Short) testing, function testing and SLT testing of semiconductor packages including BGA, LGA, QFN and QFP, as well as inspection of camera and display modules. AEM’s System Level Test portfolio covers automated SLT and back-end test including Burn-In, massively parallel asynchronous pick-and-place combined with Active Thermal Control, multi-process and multi-insertion flows, and AOI using AI and 3D inspection. The System Level Test architecture uses a massively parallel Test Cell concept and combines System Test IP & Architecture, Thermal Arrays, Change Kits, Sockets and Automation. The Configurable Test Unit, CTU, is a lab-environment building block intended to scale from laboratory work to high-volume manufacturing with common equipment and reduced correlation effort between environments. For engineering and pre-production through HVM, configurations can scale up to 320 sites with full turnkey factory automation. Markets listed for SLT include Computing, CPU, GPU and AI Chips, Memory, Mobility Application Processors and Automotive. AEM Singapore Pte. Ltd. states that heterogeneous packaging is increasing the need for high-performance, high-density modular asynchronous massively parallel test systems and for thermal solutions that manage extreme power dissipation while controlling force on Devices Under Test. The company also integrates data analytics, machine learning and AI into test tools with the goal of reducing testing cost and increasing test coverage. Wafer Test Solutions provides application-specific test solutions for MEMS devices through wafer and frame probing stations suitable for R&D, Wafer Sort and Final Test. The wafer-test portfolio includes systems for testing environmental and motion sensors in wafer form and other advanced packages. AEM Singapore Pte. Ltd. lists a production probing system with pressure stimulus, a rotating probing system for motion sensors and a 300mm cryogenic probe station among its wafer-test developments. Wafer and wafer-frame probe stations are optimized for test and calibration of Pressure Sensors, Accelerometers, Gyroscopes, E-Compass or Magnetometer devices and Cryogenic Wafer Probing applications. Named wafer-test products include AIOLOS, MPP, KRONOS and MSU10, alongside Cryogenic Wafer Probing solutions. AEM’s custom application-specific ATE Test Solutions provide a test suite combining Test Systems hardware, software and support services. M5S is a zero-footprint 5 Slot Tester with 5 Universal slots and air cooling for low digital pin-count devices with analog and mixed-signal requirements in Space, Military, Industrial and Sensors markets. M5S-HD is a zero-footprint 5 HD Slot Tester with up to 1024 pins, 128 A and 5 Universal high-density slots for medium digital pin-count devices and low-parallel testing in Mobility, Consumer, Computing and Automotive markets. M10S-HD is a zero-footprint 10 HD Slot Tester with up to 2048 pins, 256 A and 10 Universal high-density slots for high digital pin-count devices and high-parallel testing of devices including CPU, Chipset, Microcontrollers and Memory. The Application Specific Tester uses 5-10 Universal high-density slots with application-specific instruments for Consumer and application-specific markets, including Image Sensors and MIPI interfaces. AEM Singapore Pte. Ltd. states that it has more than 40 years of ATE development and uses a proprietary FPGA-based architecture intended to lower Cost of Test for semiconductor manufacturers and vendors. The ATE portfolio targets Digital IC’s, SOC and SiP IC’s, Memory IC’s and Sensor IC’s and scales from Engineering to High Volume Manufacturing for Wafer Sort and Final Test. Its ATE evolution lists FAIRCHILD and Schlumberger in 1980, nptest in 2002, credence and Mu-Test in 2004, incorporation in 2010, Device Characterization in 2011, High Volume Manufacturing in 2014 and AEM ATE in 2020. The ATE platform uses proprietary FPGA-based instruments for application customization and an open-platform capability, and the company is ISO 9001:2015 certified. The complete ATE solution includes Test Programming with AEM ATE Software, Diagnosis with AEM Test Equipment, and interfacing to a Handler with DUT, Prober or Handler with DUT, Prober for Wafer Test, and Handler for Package Test.
Capabilities and products
- System Level Test handlers
- Final Test handlers
- multi-purpose probers
- high-power active thermal control testing
- mixed-signal ATE
- high-power high-parallel automated burn-in testing
- sub-2K cryogenic quantum-wafer probing
- full-wafer cryogenic probing for 300mm wafers
- test sockets for BGA/LGA/QFN/QFP
- O/S, functional and SLT test interfaces
- automated SLT and back-end burn-in
- wafer/chip handling and process automation