At a glance
| Booth | R7312 |
| Country | KR |
| Website | www.yjsys.co.kr |
Company profile
YUJEONG SYSTEM introduces optimized solutions that maximize the efficiency of semiconductor testing, built on accumulated system development experience and unique research and development capabilities. Main products: Memory Test Solution, World No. 1 in mobile FLT, comprising Field Level Tester, Test Board, AP Kit, DUT Block and Socket. A single or multi parallel Field Level tester validates memory component or module at the OS level in AP/CPU-based, real-user environments for mobile, PC, and server platforms. Thermal Control Solution: Temperature Control Rack and Ultra Low Temp. Chamber, applying efficient, fast-response nonlinear robust control to a thermoelectric module, combined with a high efficiency water cooled heat dissipation jacket using an MFC (Micro-Flow Cooling) for hot and cold test conditions. Test Automation Solution, world only handler-integrated FLT: Handler Integrated Auto Tester and Semi-Auto Tester, an integrated, automated test equipment with our patented temperature control solution that, through unified design and control of tester and handler, delivers high efficiency and operational stability. HBM Cube SLT Solution, world first all-pin and real-speed tester: HBM SIP Level Tester, HBM All-Pin Tester, HBM Die Level Tester and HBM Real Speed Tester, the world's first System Level tester capable of HBM all-pin testing, supporting full-I/O functional testing under real-speed HBM operating conditions. Final Test Solution: DDR Component Final Tester, Flash Component Final Tester and DDR Module Final Tester, supporting final testing in the back-end process with DC, functional and real-speed test for memory component and module, and enhanced versatility to cover multiple types by changing the DSA (Device Specific Adaptor).
Capabilities and products
- optimized solutions for semiconductor testing efficiency
- Field Level Tester memory test solution
- OS-level memory component and module validation
- HBM all-pin system level tester
- full-I/O functional testing at real-speed HBM conditions
- nonlinear robust control of thermoelectric module
- MFC micro-flow cooling water cooled heat dissipation jacket
- handler integrated automated test equipment
- DDR component and module final testers
- device specific adaptor exchange for multi-type coverage
- temperature control rack and ultra low temperature chamber
- HBM die level and SIP level testers