At a glance
| Booth | R7312 |
| Country | KR |
| Website | www.yjsys.co.kr/en/product/index.php |
Company profile
Yujeong System Co., Ltd. supplies semiconductor test equipment, IoT solutions, and other offerings and presents optimized solutions intended to maximize semiconductor-testing efficiency. The company describes accumulated system-development experience and distinctive R&D capabilities as the basis for products and services intended to create customer value beyond customer satisfaction. Its memory-test equipment includes a single or multi-parallel mounted-device tester that inserts and removes a memory component or module from a socket and performs OS-level testing in AP/CPU-based real-user environments for mobile, PC, and server platforms.
Exhibits
The Memory Test Solution includes Field Level Tester, Test Board, AP Kit, DUT Block, and Socket products, with a single or multi-parallel Field Level Tester that validates memory components or modules at the OS level in AP/CPU-based real-user environments for mobile, PC, and server platforms. The Thermal Control Solution includes a Temperature Control Rack and Ultra Low Temp. Chamber and applies fast-response nonlinear robust control to a thermoelectric module together with a high-efficiency water-cooled heat-dissipation jacket using MFC, Micro-Flow Cooling, for hot and cold test conditions. The Test Automation Solution includes Handler Integrated Auto Tester and Semi-Auto Tester and combines a patented temperature-control solution with unified tester-and-handler design and control to provide automated testing with high efficiency and operational stability. The HBM Cube SLT Solution includes HBM SIP Level Tester, HBM All-Pin Tester, HBM Die Level Tester, and HBM Real Speed Tester and is described as a system-level tester capable of HBM all-pin testing with full-I/O functional testing under real-speed HBM operating conditions. The Final Test Solution includes DDR Component Final Tester, Flash Component Final Tester, and DDR Module Final Tester for semiconductor back-end final testing. Final-test capability covers DC, functional, and real-speed testing of memory components and modules and is designed to cover multiple device types by changing the DSA, Device Specific Adaptor. Across these product families, Yujeong System Co., Ltd. addresses memory testing in actual-use environments, hot and cold testing, automated inspection and handling, HBM all-pin and real-speed system-level testing, and final testing in the semiconductor back-end process. The memory-test description emphasizes AP/CPU-based mobile, PC, and server environments rather than only isolated component-level electrical checks, while the thermal-control system combines thermoelectric control with water-cooled heat removal for temperature-conditioned testing. The integrated automated tester uses the company's patented temperature-control solution and unified tester-and-handler architecture, and the HBM system-level platform extends the test scope to full-I/O operation at real HBM speed. The product page presents these memory, thermal, automation, HBM, and final-test solutions as an integrated set of tools for increasing semiconductor-test efficiency and stability across component, module, system-level, and back-end test stages. The product structure groups the equipment into five solution families: Memory Test Solution, Thermal Control Solution, Test Automation Solution, HBM Cube SLT Solution, and Final Test Solution.
Capabilities and products
- memory OS-level testing in AP/CPU-based real-user environments
- hot/cold test thermal-control system
- handler-integrated automated test equipment
- HBM all-pin real-speed system-level testing
- DC/functional/real-speed final testing for memory components and modules