At a glance
| Booth | T9143 |
| Country | TW |
| Product categories | Burn-In Accessory Systems · Burn-In Systems · Discrete Component Test Systems · Environmental Stress Systems - Temperature; Humidity; Pressure; HAST · Functional Test Systems · Linear Test Systems · Package Test Systems · Parametric Test Systems · Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair |
| Website | xtestek.com |
Company profile
Xtreme Testek Inc.: An Innovative Pioneer in High-Power Semiconductor Measurement Xtreme Testek Inc. is a technology leader in the field of third-generation semiconductor measurement. We specialize in the electronic characterization of semiconductors such as SiC (Silicon Carbide) and GaN (Gallium Nitride). Leveraging our proprietary, state-of-the-art platform which seamlessly integrates harsh testing conditions like high current, high voltage, high frequency, and high temperature, we can precisely perform both static and dynamic characterization of SiC and GaN. To meet the diverse development needs of our clients, we offer flexible business models that include professional "outsourced testing services" and the sale of highly efficient "test platforms." We are committed to being your strongest partner in research, development, and production. Our core expertise extends beyond just measurement. By leveraging our deep knowledge accumulated in the high-power and high-frequency wireless domains, we have successfully expanded our proficiency into cutting-edge application markets. We provide high-performance Power Amplifier (PA) modules and smart antennas for Low Earth Orbit (LEO) satellites and unmanned communications (drones, robots). Concurrently, we also deliver stable and reliable system solutions for smart electricity meters, smart gas meters, and green energy monitoring systems. Xtreme Testek Inc. is more than just a measurement expert; we are your partner in advancing into the high-performance era.
Capabilities and products
- Power Amplifier (PA) modules for LEO satellites and drones
- SiC and GaN test platforms
- dynamic characterization of SiC and GaN
- electronic characterization of GaN semiconductors
- electronic characterization of SiC semiconductors
- high-current high-voltage high-frequency high-temperature test platform
- outsourced semiconductor testing services
- static characterization of SiC and GaN