At a glance
| Booth | K2490 |
| Country | TW |
| Website | www.tekcrown.com |
Company profile
Tek Crown Technology Co., Ltd. was founded in 2007 and specializes in semiconductor IC test interfaces. The company is authorized by Kobelco for C3 coating, MIXNUS for Spring Probe, and Princo, and states that it is dedicated to providing customers with professional products and services. Its headquarters is located in Taoyuan, Taiwan, where Tek Crown Technology Co., Ltd. was established in 2007. In 2014, Tek Crown Europe GmbH was established in Kümmersbruck, Germany, and a sales office was set up in Zhubei, Taiwan. In 2015, Tek Crown Technology was established in Irvine, USA, followed by a Kaohsiung, Taiwan sales office in 2016. Its listed main products and services include test sockets, test probes, C3 Coating, changeover kits, socket layout kits, strip contactors and other testing contactors, and Probe Station System.
Exhibits
Tek Crown's advanced semiconductor testing and sorting solutions address discrete components including chip capacitors, resistors, and tantalum capacitors, using a mature turret platform with self-developed AI vision inspection and electrical testing software. The platform is described as supporting automotive-grade reliability and Industry 4.0 compatibility while combining high-efficiency testing with high-precision sorting. For chip capacitors, the SC21 Chip Capacitor Testing & Sorting Machine reaches throughput up to 60K UPH and supports 01005 components measuring 0.2×0.1mm. The same platform lists positioning accuracy of 0.001mm and a modular design that can flexibly integrate vision and electrical-test modules for specific defect-detection requirements. Applications include single-layer chip capacitors, MLCC, and chip resistors, and special test environments include TCR, high-voltage, and high/low-temperature testing. Its high-performance resistor test equipment is described for automotive-grade reliability under AEC-Q200 and covers a resistance range from 1Ω to 15GΩ. Dynamic TCR automatically measures at user-defined temperature points for high-temperature TCR testing, while the resistor-test equipment lists throughput of 7K UPH. DC Withstand Voltage and Pulse Withstand testing are included to screen devices with surge vulnerabilities. For tantalum capacitors, the testing and sorting system provides high-voltage testing up to 150VDC across the full series and includes a 100% polarity check. The tantalum-capacitor platform also lists intelligent protection against overcurrent, ESD, fire, and impact, with applications in high-density storage chip stacking and advanced memory packaging. A flexible three-in-one detection platform is designed for low-volume, high-variety production, supports components as small as 0.254×0.254mm, and provides throughput up to 2K UPH. The Desktop Tri-Temperature Sorter provides active temperature control from -55℃ to 125℃ and uses a dry-gas purge to prevent condensation during low-temperature testing. The BNx-3000 Burn-in System supports up to 20,000 channels for independent monitoring and precise control from RT to 150℃ and includes an energy-saving feedback load system. Its AI-Powered Vision capability uses a self-developed AI software framework for high-precision defect analysis. The data-management function stores images and test data for historical traceability and smart monitoring, while standard API interfaces are provided to support digitalized and intelligent manufacturing. The listed testing-interface and accessory range also includes WEE TEST SOCKET, POGO PIN, STAMPED SPRING PROBE, C3 COATING, TF+ SUBSTRATE, TEECONS, PARIPOSER, CHANGE KIT, CONTACT FINGER, RF SYSTEM, and PROBE STATION SYSTEM. Together with its test sockets, spring probes, C3 coating authorization, and probe-station systems, these testing and sorting platforms cover semiconductor IC test interfaces from component contact through electrical and vision inspection.
Capabilities and products
- semiconductor IC test interfaces
- test sockets
- test probes
- supply of C3 Coating (Kobelco)
- supply of Spring Probe (MIXNUS)
- changeover kits
- socket layout kits
- Strip contactor
- probe station systems