At a glance
| Booth | P6012 |
| Country | SG |
| Website | www.sinetest.com |
Company profile
SineTEST focus on the research and development of analog/Mixed-signal & discrete device test solution, with our cutting-edge technologies, SineTEST provides the best COT test solution in the industry. Real wafer level DC+Switching test solution(with universal prober) for SIC/IGBT etc., The modular design for power discrete testing enables flexible configuration of new generation complex power module(like IPM) test solution 13 slots architecture, STT-700X can support analog/mixed-signal and discrete device. For analog test,STT-700X can configure up to 128 digital pins and 208 analog VI channels. For discrete device test, STT-700X can configure different modules like DC/UIL/DVSD /RG/CG/ Switching etc., modules for multisite CP and FT test. The modular design allows flexible test configurations with a minimal footprint... 26 slots architecture, STT-700X can support analog/mixed-signal and discrete device. For mixed-signal device test,STT-700X can configure up to 256 digital pins and 416 analog VI channels. For discrete device test, STT-700X can configure different modules like DC/UIL/DVSD/RG/CG/Switching etc., for multisite CP and FT test... 6 slots architecture, STT-300S is suitable for discrete device Lab use and engineering debug. STT-700X can configure different modules like DC/UIL/DVSD/RG/CG/Switching etc., modules for single site multi-function test. If equiped with DDC1430(1400V/30A), it can provide the fastest test time and highest UPH for small signal discrete device like diode/transistor/ mosfet etc.... Our patented technologies and solutions... World no.1 real wafer level DC+switching test solution for IGBT/SIC etc., by moving switching parameter verification to the wafer stage, SineTEST empowers wafer fabs and design houses to identify switching performance issues much earlier in the development cycle...
Capabilities and products
- DC/UIL/DVSD/RG/CG/Switching modules for multisite CP and FT test
- DDC1430 1400V/30A test module for diode, transistor and MOSFET devices
- STT-300S discrete device lab-use and engineering-debug tester
- STT-700X 13-slot analog tester with 128 digital pins and 208 analog VI channels
- STT-700X 26-slot mixed-signal tester with 256 digital pins and 416 analog VI channels
- analog/mixed-signal and discrete device test solutions
- wafer-level DC+Switching test for SiC/IGBT devices
- wafer-stage switching parameter verification for IGBT/SiC devices