At a glance
| Booth | K2170 |
| Country | TW |
| Website | www.probeleader.com.tw |
Company profile
ProbeLeader Co., Ltd was established in 2002 with its headquarters at Xiangshan Industrial Zone in Hsinchu and focuses on the design and assembly of semiconductor wafer and IC testing accessories. It has probe-card production lines at the Jinshui factory in Hsinchu and the Wuxi factory in China, together with a customer service and maintenance center in Kaohsiung. In recent years, ProbeLeader Co., Ltd has expanded into the assembly, maintenance, and sale of AOI equipment and has cooperated with suppliers to develop particle-inspection equipment, defect-inspection equipment, and compound-semiconductor-related consumables. The company is also diversifying into optoelectronics, electric vehicles, and medical industries while continuing innovation, expanding production capacity, and providing stable quality, flexible cooperation, and various services to meet customer needs. ProbeLeader Co., Ltd is committed to growing with customers and establishing long-term relationships based on mutual trust and mutual benefit. In Taiwan, the company reports four plant areas in Hsinchu and a Kaohsiung maintenance center, with named facilities including the Jinshui Factory (headquarters), the NiuPu Factory, the PuDong Factory, and the Kaohsiung Maintenance Center; since 2008, it has successively established China subsidiaries responsible for trading and sales services for probe cards, test load boards, and equipment consumables. Its listed business network includes Auro & Pro Corp., which operates the ZhongHua Factory, together with Wuxi ProbeLeader Electronics Co., Ltd., ProbeLeader Technology Co., Ltd, and ProbeLeader-Tech(Shanghai) Co., Ltd. ProbeLeader Co., Ltd also works across key inspection fields involving sensors, high-performance and low-power electronic products, the Internet of Things, and automotive electronics.
Exhibits
ProbeLeader Co., Ltd supplies semiconductor inspection products and services including probe cards, test load boards and sockets, used precision equipment and parts including ion implanters, inspection equipment and handheld instruments, and other consumables. Its work includes semiconductor wafer and IC testing, appearance inspection of semiconductor and optoelectronic products, fab particle inspection, and precision-equipment maintenance, while its products include probe cards, test load boards, AOI equipment, and particle-inspection equipment and instruments. Beyond customized test-interface design and production, its services include machine agency, sales and relocation, parts replacement and repair, and related after service. ProbeLeader Co., Ltd has introduced ESTEK AUTOMATION AOI optical inspection equipment for defect inspection of transparent and opaque IC, Lens, glass, and related items. Its wafer-test probe-card technologies include cantilever, vertical, and MEMS probe cards combined with ReW, Spring, Straight, CIS N-Type, Cobra, and MEMS probe types. ProbeLeader Co., Ltd customizes probe pitch, mechanical structures, and PCB designs to customer product characteristics, DUT materials, and electrical requirements, and uses engineering simulation analysis and high-speed signal validation to enhance signal integrity and transmission efficiency while suppressing noise interference for stable testing performance. Probe-card applications include MCU, PMIC, Analog, Mixed-Signal, Touch Panel, CMOS Image Sensor (CIS), WAT, and Mini/Micro LED. The company is developing fine-pitch, high-temperature, high-voltage/high-power, and high-speed-transmission testing solutions for AI, HPC, GPU, CPU, ASIC, and advanced-packaging requirements. Named probe-card and probe configurations include WAT Cantilever Probe Card, CIS Cantilever Probe Card, CIS Vertical Probe Card, MLO Vertical Probe Card, MEMS Vertical Probe Card, and Straight pin, Pogo pin, and Cobra pin options.
Capabilities and products
- design and assembly of probe cards for semiconductor wafer testing
- assembly, maintenance and sale of AOI equipments
- development of particle and defect inspection equipment
- cantilever probe cards
- vertical probe cards
- MEMS probe cards
- fine-pitch, high-temperature, high-voltage/high-power test solution
- high-speed transmission testing