At a glance
| Booth | I2410 |
| Country | TW |
| Product categories | Vision; ID; Bar Code Systems · CV (capacitance-to-voltage) Probe systems · Thermal Sensing, Measurement, Analysis · Functional Test Systems · Linear Test Systems · Logic Test Systems · Optical Test Systems · Parametric Test Systems · Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair · System on a Chip (SOC); Mixed Signal Test Systems · Wireless, non-contact Test Systems · Yield Mgmt; Process Control Software · Test Services or Consulting |
| Website | www.ni.com/semiconductor |
Company profile
NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements. To test smart devices, organizations are transitioning from traditional ATE and box instruments to a platform-based approach. NI's platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test. Come to NI’s booth to understand more about its uniqueness.
Exhibits
From troubleshooting technical issues and product recommendations, to quotes and orders, we’re here to help. Contact Us Perspectives showcases how NI sees what’s next in the world of test and technology. View all articles LabVIEW remains key in test, promising speed, efficiency, and new features with NI’s investment in core tech, community, and integration. Read our featured article You can request repair, RMA, schedule calibration, or get technical support. A valid service agreement may be required. Open a service request Popular Software Downloads See all Software Product Downloads You can request repair, RMA, schedule calibration, or get technical support. A valid service agreement may be required. Open a service request Did you miss NI Connect 2026? Catch up on the keynotes and discover how industry leaders are redefining the future of test with today. Engineers working on wideband 5G device designs must validate performance over more frequency bands in traditional cellular frequency ranges below 6 GHz [frequency range 1 (FR1)], and in challenging millimeter wave conditions above 24 GHz [frequency range 2 (FR2)]. New 5G devices must address carrier-aggregated scenarios, support increasingly dense modulation schemes, operate with tighter time-division duplex configurations, and be capable of high-accuracy beamforming. As 5G design test cases grow in number and complexity, engineering teams must streamline to hit aggressive market deadlines. In collaboration with 5G market leaders, NI has developed a modern lab approach that drives engineering efficiency. By combining fast, reliable, and open measurement software with a modular workbench of tightly synchronized instrumentation—from precision DC to wideband RF—we’ve unlocked powerful engineering workflows across lab roles, from interactive bring-up and debug to extensive automated validation and characterization. Understanding RF testing best practices and obtaining accurate results is crucial for efficient test procedures. Learn how to use RF instruments for the measurements required in RF characterization tests. Expedite wideband 5G RF front-end bring-up, debug, and validation with NI’s powerful combination of application software and PXI instrumentation. Control DC, digital, and RF instruments with an easy-to-use GUI—no programming required. Evaluate critical RF amplifier parameters—including linearity, output power, efficiency, and modulation quality—while running the latest linearization algorithms.
Capabilities and products
- 5G FR1 device test below 6 GHz
- 5G FR2 millimeter-wave device test above 24 GHz
- 5G carrier aggregation and dense modulation test cases
- LabVIEW test software
- NI STS RF and mixed-signal production test
- PXI instrumentation for wideband 5G RF
- RF amplifier linearity output power efficiency and modulation-quality evaluation
- RF and mixed-signal test from characterization to production