At a glance
| Booth | K2960 |
| Country | JP |
| Website | www.twmjc.com.tw |
Company profile
MICRONICS JAPAN CO., LTD. (hereinafter referred to as MJC) is mainly engaged in the development, manufacturing, and sales of probe cards used for wafer inspection in semiconductor processes, as well as semiconductor test handlers, wafer probers, and FPD inspection equipment. MJC's main product is the semiconductor probe card, an inspection tool used to determine whether a wafer is good or defective. As many as tens of thousands of needles can be mounted on a printed circuit board, and these ultra-precise probes contact the electrodes on the wafer to transmit the signals sent by the tester. MJC actively plans the main production equipment for in-house probe card manufacturing; because the entire production can be managed in-house, MJC holds a significant advantage over other companies in product development tailored to differing requirements and in the ability to meet delivery schedules. Among probe cards demanding high precision and quality, the MEMS-type "U-Probe" in particular can be used for One Touch Down testing of memory device wafers, and MJC holds the world's No.1 market share among probe cards for memory testing. MJC has an extremely strong sales track record in probe cards for memory testing, and at the 2019 SEMICON Taiwan it will also exhibit many high-performance probe cards for logic device testing. Among these probe cards is the vertical-type "Vatry," a new MJC product suitable for testing highly integrated/high-speed devices such as Logic and SoC. MJC improved the conventional vertical-type probe card into a new structure that can also accommodate high-pin-count products with more than 10,000 needles. In addition, the MEMS spring-pin structure "MEMS-SP" is highly suited for flip-chip package testing of microprocessors, SOC devices, and the like, and this probe card is highly superior in terms of contact performance and maintainability. On-site, we will also introduce probe cards for various logic device testing applications such as small Pad and LCD-Driver. At the MJC booth, in addition to probe cards, we will also introduce the latest test solutions, such as semiconductor Test Sockets with high contact stability suitable for high-frequency testing, as well as compact small-size testers and wafer probers developed for various needs ranging from analysis to power device testing. Going forward, MJC will work hand in hand with its Taiwan subsidiary, which handles sales and comprehensive after-sales service in Taiwan, to provide customers with the best solutions for semiconductor testing through high-quality products and services tailored to customers' various needs. Please be sure to visit the MJC exhibition booth.
Capabilities and products
- FPD inspection equipment
- MEMS-SP probe cards for flip-chip package testing
- MEMS-type U-Probe for memory device wafer testing
- One Touch Down testing of memory device wafers
- high-pin-count vertical probe cards with more than 10,000 needles
- probe cards for semiconductor wafer inspection
- semiconductor test handlers
- test sockets for high-frequency testing
- vertical-type Vatry probe cards for Logic and SoC testing
- wafer probers