At a glance
| Booth | K3478 |
| Country | TW |
| Website | www.IntTechCorp.com |
Company profile
Integrated Technology Corporation Taiwan Branch is part of Integrated Technology Corporation, which is based in Tempe, Arizona and has provided technology solutions to the semiconductor industry since 1975. The company serves metrology, testing and OEM equipment requirements, including IC probe-card test, analysis and repair, industrial metrology and inspection, and dynamic testing of power semiconductor devices. Its design team combines electronic, mechanical, software and optical disciplines to build total system solutions, and the company describes its equipment as designed for reliable, high-performance operation in demanding requirements. ITC states that probe-card analyzers and equipment for dynamic power-semiconductor testing are central areas of its business, with equipment used around the world and development work directed toward advancing test capability and reliability. Manufacturing follows a vertically integrated model in which ITC keeps resources in-house, including a fully equipped machine shop with automated machining centers, electrical and mechanical CAD, and complete electronic circuit-board manufacturing and testing capability. A worldwide staff of service and training personnel supports customers, complementing the company's in-house design and manufacturing resources with ongoing service for installed equipment. ITC traces its first developed product to the Navtronic Flight Computer, which was later accepted by the Smithsonian museum as a milestone in aviation, and the company presents that product as an early example of its engineering history. The company follows an evolutionary design philosophy intended to give existing customers an upgrade path rather than make older equipment obsolete, and it says upgrade solutions remain available for equipment shipped more than 20 years ago. ITC also emphasizes ongoing collaboration with new and existing customers when developing new features, new probe-card-analyzer motherboards and new test capabilities, while matching probe-card metrology and power-semiconductor test solutions to specific technologies, interfaces and customer needs. Its intellectual-property portfolio includes US Patent No. 5,657,394 and US Patent No. 6,118,894 for Integrated Circuit Probe Card Inspection System, US Patent No. 5,563,781 for Dual-Mode Power Converter, and US Patent No. 5,189,360 for Method and Apparatus for Providing Controlled Mechanical Braking Torque. The portfolio also lists US Patent No. 4,949,084 for Programmable Integrated Crosspoint Switch, US Patent No. 4,869,497 for Computer Controlled Exercise Machine, US Patent No. 4,785,674 for Torque Sensor, and US Patent No. 5,442,276 for Apparatus for Providing Controlled Mechanical Braking Torque. Semiconductor-related patents in the same partial list include US Patent No. 7,521,947 for a probe needle protection method for high current probe testing of power devices, US Patent No. 9,304,147 for a high current Kelvin connection and verification method, and US Patent No. 9,759,763 for a damage reduction method and apparatus for destructive testing of power semiconductor, while Probilt is listed as a US trademark.
Exhibits
The Probilt probe-card-analyzer line provides fast, accurate and repeatable test data across probe-card technologies, while user-definable vision parameters allow complex and newly developed probe-tip geometries to be captured and measured accurately. Named Probilt models include PB1500, PB3600, PB6500 and PB6800, and the PB6800 uses a large measurement chuck that can touch down probe arrays as large as 300 mm in diameter without the array overhanging the chuck surface. Probilt electrical measurement capability includes the ability to drive relays on any channel for probe cards with complex circuits and PCB relays, while 300Kg of lift force is specified for vertical probe-card applications. Tests listed for PB3600, PB6500 and PB6800 include leakage, OD leakage, capacitor leakage, alignment, scrub analysis, tip diameter, planarity, contact resistance, wire check, gram force and tip depth, with elevated heat levels available through the Hot Chuck option and component measurement for relays, capacitors and resistors. For power-semiconductor testing, ITC supplies tester products for production test and characterization, including Unclamped Inductive Load test systems, and links the requirement for higher UIL voltage capability to higher breakdown voltages in Silicon Carbide, or SiC, discrete power devices. ITC has developed 4000V/200A UIL capability on both 55 and 75 series testers, with ITC55100C-2HVN and ITC75100-2HVN identified as N-channel-only systems providing the 4000V/200A capability. Model ITC55100D-6KVN is identified as the latest generation of the ITC55100 tester series and uses an advanced microcontroller that improves response time to peak and zero current by a factor of ten, increasing the accuracy of charging time, avalanche time and reported peak drain current. ITC also manufactures more than 100 different motherboard types with interfaces to major tester brands and types, and can design and manufacture motherboards for new tester interfaces, including custom probe cards. These motherboards are designed to reproduce factory probe-card test conditions by emulating tester mechanical conditions with the same forces and connector-control methods, and to emulate wafer-prober card-holding conditions while maintaining the same reference surface. Together, the probe-card analyzers, dynamic power-semiconductor test systems, customized motherboards and supporting measurement capabilities address semiconductor probe and test requirements from probe-tip geometry measurement through high-current and high-voltage device characterization.
Capabilities and products
- IC probe card analyzers
- IC probe card repair solutions
- power semiconductor production-test and characterization equipment
- 4000V/200A unclamped inductive load test systems
- custom design and manufacturing of probe-card tester interface motherboards
- electronic circuit board manufacturing and testing
- upgrades for probe-card and power semiconductor test equipment
- probe-card leakage testing
- probe-card alignment measurement
- probe scrub-mark analysis
- probe-tip dimensional measurement
- probe-card planarity measurement
- probe-card contact resistance measurement
- probe-card wiring inspection
- probe contact-force measurement
- high-temperature probe-card testing with heated chucks
- probe-card relay, capacitor and resistor measurement