At a glance
| Booth | K3160 |
| Country | TW |
| Website | www.honprec.com/en |
Company profile
HON. PRECISION, INC. focuses on professional IC test handlers and automation technology and states that it has built close cooperation with global semiconductor manufacturers and equipment suppliers while providing FT, SLT and Flash/Memory solutions for evolving semiconductor-process requirements. The company also states that it has established close partnerships with global OSAT and IDM customers and describes its vision as becoming a leading IC semiconductor automation equipment company through the delivery of high-quality products and services. Its capability statements highlight machine temperature-control capability, quality and delivery, price-performance considerations and customization capability as elements used to meet different customer needs. Across its test-handler portfolio, HON. PRECISION, INC. addresses final test, system-level test, memory testing, thermal control, engineering development, burn-in, optical inspection and MEMS testing within IC and electronic-component production and development workflows.
Exhibits
The FT Test Handler supports final test, a key IC-manufacturing step used to verify final-product quality and reliability, and the equipment supports dual- and triple-temperature testing to improve production efficiency and product quality. The SLT Test Handler performs system-level testing by simulating operating conditions in real application environments so IC reliability and performance can be checked under different working conditions and failure-free operation can be evaluated for the final product. For high heat-generating chips and applications requiring tighter thermal control, the temperature-control solution can include a temperature-control system, temperature-monitoring devices and temperature regulation to maintain a stable environment across demanding temperature settings. Laboratory development equipment is described as compact for engineering development and experimental use, with precise and reliable testing and handling functions intended to help engineers identify and correct issues during R&D, improve experimental efficiency and maintain product quality and stability. The Flash Test Handler is used to test and handle flash storage devices and memories, and it can test different memory types to check performance and reliability. The DRAM Test Handler is designed specifically to test and classify Dynamic Random Access Memory, performing comprehensive checks intended to verify that DRAM meets strict requirements for efficient operation and stability. The Burn-In Oven subjects electronic elements to extended operation at high temperature so possible problems that could appear in real-world use can be exposed and durability and stability can be evaluated. The COF Test Handler tests the functionality and performance of chip-on-film packaged electronic elements to support quality and reliability checks, with alignment accuracy specified at 1.5um for precise detection and classification. The AOI Handler applies automatic optical inspection to electronic elements and is described as quickly and precisely detecting surface defects and errors so production efficiency and quality can be improved. The MEMS Test Handler is designed for Micro-Electro-Mechanical Systems devices and can test component types including Motion Sensors, Microphones, Pressure Sensors and Barometers to evaluate reliability and accuracy across different applications. Together, these systems give HON. PRECISION, INC. a test and handling portfolio spanning IC final test and system-level test, high-heat-chip temperature control, engineering-development equipment, Flash and DRAM memory testing, burn-in, COF package testing, optical inspection and MEMS device testing.
Capabilities and products
- dual- and triple-temperature FT test handler
- SLT system-level test handler
- temperature-control solutions for high heat-generating chips
- Flash memory test handler
- DRAM test handler
- burn-in oven for electronic components
- COF test handler with 1.5um alignment accuracy
- AOI automatic optical inspection handler
- MEMS device test handler