At a glance
| Booth | K3160 |
| Country | TW |
| Product categories | Burn-In Accessory Systems · Burn-In Systems · Circuit Repair; Design Modification; Redundant Memory Repair; Mask Repair Systems · Discrete Component Test Systems · Environmental Stress Systems - Temperature; Humidity; Pressure; HAST · ESD; EMS and Latch-up Systems · Failure Analysis Systems · Functional Test Systems · Handlers; Positioner Systems · Linear Test Systems · Logic Test Systems · Memory Test Systems · Optical Test Systems · Package Test Systems · System on a Chip (SOC); Mixed Signal Test Systems · Test Contactor Cleaning; Conditioning Systems · Test Head Manipulators and Docking Stations · Wireless, non-contact Test Systems |
| Website | www.honprec.com/en |
Company profile
Hon Precision Inc. — Professional IC test handlers and automation technology. Since its establishment, Hon Precision has built close partnerships with semiconductor manufacturers and equipment suppliers worldwide, becoming one of the industry leaders. We are dedicated to providing solutions such as FT, SLT, and Flash/Memory, and we continuously pursue technological innovation to meet the ever-evolving demands of semiconductor manufacturing processes.
Exhibits
Please contact us for more product information. The FT (final test) is a crucial step in IC manufacturing that ensures the quality and reliability of the final product. Our FT equipment is highly effective and precise and supports dual- and triple-temperature testing for enhanced production efficiency and product quality. The SLT (system-level test) simulates the operating condition in the real-world application environment. It ensures the reliability and performance under various IC working conditions and failure-free functionality in the final product. The temperature control solution is designed for high heat-generating chips and to meet the demand for more precise temperature control. These solutions can include the temperature control system, the temperature monitoring device and temperature regulation, so as to ensure that a steady temperature environment is maintained despite various harsh temperature settings. The compact size of the machine is fit for engineering development and experimental purposes; precise and reliable testing and handling features are available. Such equipment helps engineers identify and correct issues during the R&D stage, enhance the efficiency of experiments, and ensure product quality and stability. The flash/memory test handler is one such equipment that is used to test and handle flash storage devices and memories. The machine can test all kinds of memories to ensure their performance and reliability. The DRAM Test Sorting Handler is specifically designed for testing and classifying Dynamic Random Access Memory (DRAM). This equipment performs comprehensive checks on DRAM to ensure it meets strict standards for efficient operation and stability. A burn-in oven is equipment that tests electronic elements over an extended operating period. The elements are exposed to a high temperature and hence tested for possible issues that may occur in the real-world application, so as to ensure their durability and stability. The COF (chip-on-film) test handler is equipment that tests the COF-packaged electronic elements. The machine can test the functionality and performance of COF-packaged electronic elements to ensure their quality and reliability.
Capabilities and products
- DRAM test sorting handler
- FT final-test handling solutions
- Flash/Memory test handlers
- IC test handlers and automation technology
- SLT system-level test handling solutions
- burn-in oven and COF test handler
- dual- and triple-temperature FT testing
- temperature control for high-heat-generating chips
- temperature monitoring and regulation systems