At a glance
| Booth | J2553 |
| Country | TW |
| Product categories | Base Loader Systems · Defect; Particle; Bump; Contamination Detection, Review or Inspection · Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Line Width; Critical Dimension (CD) Measurement · Microscopes: Optical Microscopes · Overlay Measurement · Particle Monitors; Analyzers - Airborne or Liquid · Stress; Refractive Index; Reflectivity & Conductivity Measurement · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · Cameras - Still; CCD; Video & Monitors · Yield Mgmt; Process Control Software · Measurement; Inspection Service |
| Website | www.cxsemi.com.tw |
Company profile
CXsemi was founded in 2010 to provide professional, efficient, and high quality technical service to our customers. Our specialty is in the sales and service of used semiconductor equipment, microscope, Smart machine / 3D IC / WLP /LED / film thickness metrology tool, etc. Our corporate core values are integrity, efficiency, passion, and patience. We are a customer service driven company and we strive to bring best values to our customers. Our team is always extending our core technology to emerging applications and to meet more customers’ requirements. This is our way of creating long term values that would benefit our customer.
Capabilities and products
- 3D IC, WLP and LED film thickness metrology tools
- Smart machine equipment sales and service
- microscope sales and service
- used semiconductor equipment sales and service