At a glance
| Booth | S7837 |
| Country | CN |
| Website | en.tonghui.com.cn/overview.html |
Company profile
Changzhou Tonghui Electronic Co. Ltd. was founded in 1994 and is a provincial high-tech enterprise integrating R&D, manufacturing, and marketing. The company is located in the National Development Zone, Changzhou Hi-tech Industry Development Zone, on 38000 m2 of land with 3000 m2 of construction area, and it has more than 200 employees, with more than 75% holding college education or above. R&D personnel account for more than 25% of employees, and annual R&D investment exceeds 10% of annual revenue. Tonghui has devoted more than 20 years to the research and development of electronic measurement instruments and established the Changzhou electronic component measuring instrument engineering research center, which has undertaken ministry, province, city, and district science and technology projects and received provincial and city science and technology progress awards. Its products include electronic component parameter test instruments, winding component test instruments, cable harness test instruments, electrical safety test instruments, resistance test instruments, power electronic testing instruments, data acquisition and recorders, digital multimeters, other instruments, accessories, and software products. The company combines a quality-control system with product manufacturing and quality-assurance teams to meet unified quality standards and provides measurement solutions aimed at more efficient measurement and higher product quality. Tonghui uses a multi-level marketing system combining direct marketing, agency, and network sales and has established an after-sales service system in more than 20 provinces and cities in China. Its overseas marketing systems cover North America, Europe, Southeast Asia, and South Asia, supporting worldwide customers and exchanges with international counterparts. In 2015, Tonghui was listed on the National Equities Exchange and Quotations with stock code 833509.
Exhibits
Product areas include component-parameter testing instruments, weak-signal testing instruments, power-electronics testing instruments, semiconductor testing instruments, safety and wire testing instruments, an integrated-circuit teaching experiment platform, automatic test systems (ATE), and instrument accessories. The semiconductor lineup includes a Semiconductor C-V Characteristic Analyzer for wafer C-V characteristic analysis. The product portfolio also includes Semiconductor C-V Analyzer, Impedance Analyzer, Benchtop and Handheld LCR Meters, DC Bias Current Sources, Automatic Transformer Test systems, Precision Source Measurement Units, Low Noise Precision Power Supplies, DC and insulation resistance meters, battery testers, digital multimeters, AC and DC power supplies, bidirectional DC power supplies, DC electronic loads, power meters, safety-compliance analyzers, impulse winding testers, cable and harness meters, Hipot testers, and ground-bond testers. The TH511/TH512/TH513 Semiconductor C-V Characteristic Analyzer covers 1kHz-2MHz, measures Ciss, Coss, Crss, and Rg, provides a Vgs range of +/-40V, Vds ranges of 200V/1500V/3000V, and supports 1 to 6 channels depending on configuration. TH511/TH512/TH513 features include a 10.1-inch capacitive touch screen with 1280*800 resolution and Linux, a dual-CPU architecture with LCR test speed down to 0.56ms, spot test, list scan and optional graphic scan, simultaneous display of Ciss, Coss, Crss and Rg, CV and Ciss-Rg curve scans, and an integrated LCR + VGS low-voltage source + VDS high-voltage source + channel switching + PC design. A standard 2-channel configuration can test two devices or dual-chip devices simultaneously and can expand to 6 channels, while fast charging shortens capacitor charging time and supports fast testing; the analyzer also provides automatic delay setting, high-bias VGS 0 to ±40V and VDS 0 to 200V/1500V/3000V, and 10-bin sorting. Applications include parasitic-capacitance and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, and other semiconductor or power components; wafer C-V characteristic analysis; liquid-crystal elastic-constant analysis; and capacitor or capacitive-sensor C-V testing and analysis. The analyzer supports a 5mVrms-2Vrms test-level voltage range, Vgs from 0 to ±40V, Vds from 0 to 200V, 1500V, or 3000V, 100Ω ±2%@1kHz output impedance, OPEN/SHORT/LOAD calibration, measurement averaging from 1 to 32 times, and AD conversion modes from Fast+ 0.56ms at frequencies above 5kHz through Slow 220ms. Measurement ranges include 0.00001pF to 9.99999F for Ciss/Coss/Crss and 0.001mΩ to 99.9999MΩ for Rg, while multi-function parameter list scan supports 20 spots and graphic scan supports up to 1001 spots with single or continuous triggering and graphics or file result storage. Comparator functions include 10Bin, PASS and FAIL with tolerance or continuous bin modes and bin counts from 0 to 99999, and the instrument can batch-read 201 measurement results and store setup files internally or test setup files, screenshots, and log files on external USB. Interfaces include two USB HOST interfaces, USB DEVICE compliant with USB TMC-USB488 and USB2.0, 10/100M Ethernet LAN, HANDLER, RS232C, and RS485; operating specifications include a 60 Minutes boot warm-up time, 100-120VAC/198-242VAC input at 47-63Hz, more than 130VA power consumption, 430*177*405 mm dimensions, and 12kg weight. Standard fixtures and cables include TH26063B and TH26063C Test Fixtures, TH26063D TH510 fixture-control connection cable, and TH26063G TH510 Test Extension Cable.
Capabilities and products
- electronic measurement instrument R&D
- Semiconductor C-V characteristic analyzer
- impedance analyzer
- benchtop LCR meter
- handheld LCR meter
- DC bias current source
- capacitance meter
- automatic transformer test system
- inductance DC bias test system
- precision source measurement unit
- low-noise precision power supply
- capacitor leakage-current and insulation-resistance meter
- DC resistance meter
- insulation resistance meter
- battery tester
- digital multimeter
- digital AC millivoltmeter
- AC power supply
- DC power supply
- bidirectional DC power supply
- DC electronic load
- power meter
- multifunction safety compliance analyzer
- impulse winding tester
- cable and harness meter
- hipot tester
- ground bond tester
- data acquisition/recorder
- electronic measurement instrument accessories
- electronic measurement instrument software
- parasitic-capacitance and C-V analysis of semiconductor/power components
- wafer C-V characteristic analysis
- liquid-crystal material elastic-constant analysis
- capacitor C-V characteristic testing and analysis
- capacitive sensor testing and analysis