At a glance
| Booth | K3183 |
| Country | TW |
| Website | www.cmat-tek.com.tw |
Company profile
Certain Micro Application Technology Inc., also presented as CMAT, is a Taiwan manufacturer of semiconductor inspection equipment and a specialist in semiconductor test-interface components. The company was founded in June 2006 and develops semiconductor inspection equipment together with testing materials, tools, equipment components, and Probe Card components used for wafer testing. Its customer scope includes IC design, manufacturing, packaging, testing, and optoelectronic-testing companies, linking the company's inspection and interface-component work to multiple stages of semiconductor production and test. CMAT describes its manufacturing foundation as precision structural-component capability and develops the specific test materials, instruments, and device components required by the semiconductor industry. The company evaluates its work by customer satisfaction and success and supports fully customized manufacturing around customer requirements. This combination of equipment manufacturing and test-interface component specialization lets CMAT serve both inspection-system needs and the precision parts required where semiconductor devices are electrically tested.
Exhibits
CMAT manufactures semiconductor inspection equipment, develops semiconductor test materials, tools, and equipment components, and manufactures Probe Card components used in wafer testing. Its precision structural-component manufacturing capability is used to develop testing materials, instruments, and device components for semiconductor applications, with customized manufacturing matched to customer needs. For advanced-process testing, CMAT provides micro-drilling machining services for ceramic guide plates used in key Probe Card components. The company applies long-term experience in process-technology research and development and production to tailor these micro-drilling services to the specifications required by customers. Available workpiece materials include ceramics, silicon nitride, machinable glass microcrystalline ceramics, and related materials. The machining service can produce round holes, square holes, stepped holes, and tapered holes so the ceramic guide plate can accommodate different probe styles used by customers. Because the ceramic guide plate is a key part of Probe Cards used for advanced-process testing, the micro-drilling capability connects CMAT's precision structural manufacturing directly with wafer-test interface requirements. The combination of inspection-equipment manufacturing, test-material and tool development, equipment-component supply, Probe Card component manufacturing, and tailored micro-drilling gives CMAT a service range spanning equipment and critical test-interface parts. By supporting multiple hole geometries and multiple ceramic-related materials, the micro-drilling service can be adapted to the different probe configurations customers select for advanced-process Probe Cards.
Capabilities and products
- semiconductor inspection equipment manufacturing
- semiconductor test materials and tools development
- semiconductor equipment component development
- wafer-test Probe Card component manufacturing
- micro-drilling of ceramic guide plates for Probe Cards
- round, square, stepped and tapered micro-hole machining