At a glance
| Booth | I3216 |
| Country | TW |
| Website | www.sgservice.com.tw/en |
Company profile
Scientific Gear Service Co., Ltd. focuses on X-ray analytical services and related equipment, combining premium synchrotron X-ray technology teams with in-house complementary metrology for non-specialist clients in a straightforward, time-efficient, and cost-effective service model. The company provides technical support for cause analysis and problem solving in research, development, and manufacturing using innovative analytical techniques and physical analyses, and it states that it works to maintain cutting-edge analytical techniques and new analytical methods. Scientific Gear Service Co., Ltd. states that its work is intended to promote and accelerate the progress and efficiency of scientific research.
Exhibits
Scientific Gear Service Co., Ltd. covers SAXS/WAXS applications for soft condensed matter and develops inline X-ray inspection for advanced semiconductor manufacturing as well as X-ray inspection for advanced packaging. Its Room-Temperature Powder X-ray Diffraction (RT-PXRD) service examines crystallographic structure at ambient conditions and can provide qualitative and quantitative, non-destructive information on crystalline structure, phase composition, and crystallinity for materials including pharmaceuticals, polymers, metals, and ceramics. The same RT-PXRD material explains that synchrotron XRD offers higher intensity, tunable wavelengths, and higher resolution than conventional lab-source XRD, with synchrotron radiation described as 100 to 1000 times more intense than conventional analyzers together with focused beams, a broad energy spectrum, and a brief pulsed time structure. RT-PXRD can determine unknown crystal structures by Rietveld refinement and study mixture phases and crystal-size distribution. Nano-Beam X-Ray Fluorescence Mapping (2D n-XRF) provides nanoscale elemental mapping and high-resolution imaging with 80 nm spatial resolution, more bulk sensitivity than SEM, and no special precondition requirements. Nano-Beam X-Ray Nanodiffraction (2D n-XRD) uses Laue diffraction with 80 nm spatial resolution to characterize local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization. Nano-Beam X-Ray Absorption Mapping (2D n-XAS) is used to understand inhomogeneous material distributions, including edge shifts, under different treatment conditions. Nanoscale Transmission X-ray Microscopy (2D/3D n-TXM) uses a capillary to achieve 60 nm spatial resolution for 2D absorption-contrast imaging and 3D computed tomography and is described for soft and biomaterials. The service portfolio also includes Synchrotron Micro-Computed Tomography and Grazing-Incident Wide-Angle X-Ray Scattering (GI-WAXS), with GI-WAXS collecting wide-angle scattering at grazing incidence across a large sample area for averaged structural information. Japan Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV) examines local atomic structure through absorption-spectrum oscillations to determine neighboring-atom distances, types, and numbers, while Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV) provides information on valence state, energy bandwidth, and bond angles. Specular X-ray Diffraction (θ-2θ scan) is described as a nondestructive method providing information on crystal structure, phase, orientation or texture, grain size, crystallinity, strain, and crystal defects. X-ray 2D Radiography (Transmission Image)-FPD and 3D X-ray Nano Computed Tomography use a nano-focus X-ray source together with CdTe detectors for high-energy industrial imaging, and the company also offers analysis of customer 3D CT data for volume, porosity, defects, critical dimensions, and internal features. The MUST Ultra-fast X-ray CT system is listed with sub-micron resolution, non-destructive operation, inline-ready integration, and low dose and cost for real-time monitoring. Its Strain and Defect Analyzer of SiC Ingot/Wafer uses X-ray NDT to obtain orientation, strain and stress, and BPD/TED/TSD defects in SiC ingots and wafers in a very short inspection time. The Excillum MetalJet E1+ 160 kV is listed at 1000 watts and described as delivering 17 times more X-ray flux across a broad spectral range than a 30 W conventional tungsten-solid-anode microfocus source with the same 30 µm. The Excillum NanoTube N3 is based on advanced electron optics and tungsten-diamond transmission-target technology and includes automatic e-beam focusing and astigmatism correction. DECTRIS EIGER2 X/XE CdTe photon-counting detectors support hard X-ray energies up to 100 keV with 75 µm spatial resolution and a 750 µm cadmium-telluride sensor, frame rates up to 2,000 kHz, under 100 ns effective dead time, two independent energy thresholds, multiple geometries and performance configurations, and optional vacuum capability. DECTRIS EIGER2 S photon-counting detectors use 75-µm pixels, two independent energy thresholds, a single-pixel point-spread function, frame rates up to 1 kHz, and a 450 µm silicon sensor covering 6 to 40 keV, and are offered in multiple sizes. DECTRIS MYTHEN2 R strip detectors are described for X-ray diffraction, scattering, and spectroscopy, with radiation hardness, maintenance-free operation, a 50 μm strip width, single-photon counting, noise-free performance, and an X-ray energy range from Ti to Ag. DECTRIS ARINA is a retractable electron-counting detector for 4D STEM, with speeds up to 120,000 frames per second, high dynamic range, noise-free readout, operation across 30-300 keV, and 4D STEM applications with dwell times below 10 μs including crystalline-phase and orientation mapping, ptychography, and flexible STEM image reconstruction with virtual detectors. DECTRIS QUADRO is a direct electron detector based on hybrid-pixel technology with instant retrigger, continuous readout, noise-free acquisition, and count rates up to 10 million el/s/pix; its high dynamic range can remove the need for a beam stopper in applications including microED, electron imaging, strain imaging, and ptychography. DECTRIS ELA is an electron-counting detector that handles probe currents well over 100 pA, simultaneously captures weak and intense reflections, supports fast elemental mapping, and is optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM). DECTRIS SINGLA is a hybrid-pixel electron-counting camera for Life Science applications with a sensitive area of roughly 1,000 x 1,000-pixels and readout exceeding 2,000 frames per second, supporting cryoEM, microED, single-particle analysis, cryo-electron tomography, small-molecule and 3D micro-crystallography, and compatibility with JEOL and Thermo Fisher Scientific TEM systems. Scientific Gear Service Co., Ltd. also lists customized design and manufacture of a multifunctional nanoscale computed tomography system. On April 18, 2026, Scientific Gear Service Co., Ltd. listed new-product items for next-generation X-ray inspection for advanced packaging and inline X-ray inspection for advanced semiconductor manufacturing.
Capabilities and products
- room-temperature powder X-ray diffraction analysis
- unknown crystal structure determination by Rietveld refinement
- nano-beam XRF elemental mapping
- 3D nano X-ray computed tomography