At a glance
| Booth | I3216 |
| Country | TW |
| Product categories | Microscopes: Atomic Force Microscopes (AFM) · Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes · Microscopes: Optical Microscopes · Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr · X-ray; XRF; 3-D X-Ray; LEXES Systems · Test Services or Consulting |
| Website | www.sgservice.com.tw/en |
Company profile
Since SGService has been committed to providing the best total solution in the field of x-ray analytical service and as well as related equipment. World-leading creative “paid” service of premium synchrotron x-ray technologies teams with critical in-house complementary metrology, to provide extraordinary experiences to our non-specialist client in a more straightforward, time-efficient and cost-effective way.
Exhibits
Application of SAXS/WAXS for soft condensed matter We have been engaged in providing technical support for "cause analysis" and "problem solving" in the fields of research, development and manufacturing, using innovative analytical techniques and physical analyses. We always try to possess cutting edge analytical techniques and brand new analytical methods.[請提供] SGService Redefines Inline X-ray Inspection for Advanced Semiconductor Manufacturing SGService at SEMICON 2026 – Visit Us at Booth I3216 Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution. 2D nano-X-ray fluorescence (n-XRF) analysis provides detailed elemental mapping and high-resolution imaging at the nanoscale, providing researchers and scientists with valuable insights into sample composition. 80 nm spatial resolution to characterize the distribution of local elements and more bulk sensitivity compared to SEM. There are no special precondition requirements. Laue diffraction with 80 nm spatial resolution to characterize the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization. Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions. nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing incidence to cover a large sample area for average information. These large values of q correspond to The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms. XRD is a nondestructive method to provides information on crystal structure, phase, orientation or texture, grain size, crystallinity, strain, and crystal defects.
Capabilities and products
- 2D nano-XRF elemental mapping at 80 nm spatial resolution
- Laue diffraction for 80 nm local deformation, stress, and strain analysis
- Rietveld refinement for unknown crystal structure determination
- SAXS/WAXS analysis for soft condensed matter
- XRD nondestructive crystal structure analysis
- inline X-ray inspection for advanced semiconductor manufacturing
- nano-TXM at 60 nm spatial resolution
- synchrotron X-ray analytical service