At a glance
| Booth | K3082 |
| Country | TW |
| Website | www.intifar.com/company_en.php |
Company profile
Intifar Global Co., Ltd was founded in 2012 and provides intelligent in-line monitoring software solutions and services for the semiconductor industry. Its R&D team also develops ESD solutions intended to provide high-accuracy, high-stability and long-term static-dissipative protection on production lines, adding electrostatic-protection work to its software and monitoring activities. The company operates its own technology-development team, with many members coming from semiconductor-related fields and bringing semiconductor-industry experience to the rapid and accurate delivery of integrated solutions. Its main product and service areas include software development, hardware monitoring products, ESD coating and integrated solution design, supported by experience in industrial hardware and software integration. Intifar Global Co., Ltd combines advanced R&D with big-data analysis as it develops toward Internet of Things intelligent applications and provides customized efficiency-optimization programs according to customer demand. The company states that it continuously improves its own technologies to enhance product performance, meet customer expectations and deliver complete solutions through multi-faceted resource integration, with customer satisfaction and market benefit as stated business-management goals.
Exhibits
The semiconductor-test offering includes Inline Test Data Analysis for Part Average Test Yield Management, connecting in-line test-data analysis directly with PAT yield-management work. Shield is an Inline Test Data Analyzer and real-time supervision and control system for semiconductor testing, with real-time intelligence dashboards that provide drill-down automated issue analytics and solution recommendations intended to turn production data into productivity. Shield Central Data Management combines real-time supervision and control with advanced analytics for manufacturing-data quality and reliability-issue prevention, giving the system a central view of production-test information and detected conditions. The Production Monitor collects real-time data for each touchdown from ATE without modifying the current production environment, allowing production-test information to be gathered while the installed test flow remains in place. Inline SPC Control supports rule setting by Device / Test Program, Inline SPC Gating and Inline Tester Control, linking statistical process-control rules with direct supervision of semiconductor tester operation. Supported tester types listed for the system include Advantest 93000, Teradyne Platform with UltraFlex and J750 Series, LTX, VLCT and D10 / DX. The data scope includes Lot Information, HardBin, SoftBin, Test Time, Index Time and individual test items including parametric and functional results, providing the data fields used by monitoring, analysis and yield-management functions.
Capabilities and products
- semiconductor in-line monitoring software
- production-line ESD static-dissipative protection
- real-time semiconductor test data analysis and monitoring (Shield)
- Part Average Test yield analysis
- real-time ATE touchdown data collection
- Inline SPC gating and tester control