基本資料
| 攤位 | I2101 |
| 國別 | TW |
| 產品分類 | Defect; Particle; Bump; Contamination Detection, Review or Inspection · Fiber Optic Inspection Instruments · Film Thickness; Thickness; Uniformity Measurement; Ellipsometer · Instruments; Bench Top Test · Spectrometers; Fourier Transform Infrared (FTIR); Attenuated Total Reflectance FTIR (ATR-FTIR); Auge · Stress; Refractive Index; Reflectivity & Conductivity Measurement · Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation · X-ray; XRF; 3-D X-Ray; LEXES Systems · Equipment, Nanotechnology Tools · Inspection and Metrology · Integration and Automation · Thin Film · Coat; Develop; Resist Processing; Track Equipment · FPD Test; Measurement; Repair Equipment · Optical Test Systems · Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers · Wireless, non-contact Test Systems · Test; Monitor Wafers; Reclaim or Virgin · Thin & Thick film substrates for MEMS · Lamps (non Lithography), all type UV; LED and other · Cameras - Still; CCD; Video & Monitors · Exposure; Illumination Sources - Laser; Lamp; X-ray & other · Optics; Lens Products; Auto-Focus Systems · Measurement and Control Technology · Test Programs · Calibration & Reference Standards · Certification; Compliance; Independent Laboratories · Measurement; Inspection Service · Test Services or Consulting · Analytical Standards; Calibrators · Laboratory Apparatus and Supplies |
| 網站 | www.hmtech.com.tw |
公司簡介
Hong-Ming Technology Co., Ltd. 是一家台灣光學量測、光譜與光電相關系統供應商。公司官方網站列出 Hong-Ming Technology，產品包括深紫外光可變角度穿透反射量測系統、高光譜影像軟體、巨量光譜影像分析儀、氙鹵光源、顯微分光光譜儀與可調波長光源系統。英文網站也在 Hong-Ming Technology Co., Ltd. 名下提供新北市樹林區地址與聯絡資訊。台灣公司登記來源與 HONG MING TECHNOLOGY CO., LTD. 英文名稱及相同地址相符。依據可取得來源，該公司最適合描述為儀器與光學量測供應商。其半導體關聯可能來自量測、檢測與光源應用，但已取得的官方頁面未提供詳細的半導體專用定位說明。
能力與產品項目
- 氙鹵素光源
- 波長可調光源系統
- 深紫外可變角穿透率與反射率量測系統
- 膜厚、均勻性量測與 ellipsometry 儀器
- 顯微光譜儀
- 高光譜影像分析儀
- 高光譜影像軟體