At a glance
| Booth | T9404 |
| Country | US |
| Website | www.nicslab.com |
Company profile
XDAC Precision multi-channel Source Measure Units for semiconductor characterization and automated testing. Mini ATE Mixed-signal automated test equipment integrating analog force and measure directly into digital test vectors. XSOM Compact system-on-module photonic IC driver for controlling TOPS, biasing photodiodes, and dedicated laser/TEC. XEIC A compact digital IC that unifies multi-channel DAC/ADC control into a single SPI interface, engineered to simplify high-density photonic and electronic test systems.
Exhibits
Products include XDAC Precision multi-channel Source Measure Units (SMUs), Mini ATE mixed-signal automated test equipment, XSOM compact system-on-module photonic IC driver, and XEIC compact digital IC integrating multi-channel DAC/ADC control through a single SPI interface.
Capabilities and products
- XDAC precision multi-channel Source Measure Units
- Mini ATE mixed-signal automated test equipment
- integrating analog force and measure into digital test vectors
- XSOM compact system-on-module photonic IC driver
- biasing photodiodes and dedicated laser/TEC control
- XEIC unifying multi-channel DAC/ADC control into a single SPI interface
- engineered to simplify high-density photonic and electronic test systems